Daniel Abou-Ras

Combining imaging, compositional, and electrical analysis on identical positions at the subnanometer level, in order to:

- determine the composition at and around extended structural defects, as important input for ab-initio, density-functional theory calculations.

- identify atomic reconstruction, strain, or redistribution of free charge carriers as dominating mechanism of relaxation at extended structural defects

- monitor phase segregation in nanoparticles in-situ