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Ambient Pressure X-ray Emission Spectroscopy

Currently, a high-transmission, moderate-resolution, soft x-ray fluorescence spectrometer for the EMIL endstation is under development. This spectrometer is the necessary first step toward the longer term development of an experimental “backbone” and scientific program revolving around the study of materials under atmospheric conditions allowing in-situ and in-operando analysis of energy-related systems that are not traditionally compatible with UHV techniques (e.g., photoelectrochemical cells).

Such studies require looking through a membrane and often through a liquid film, and so the use of photon-in/photon-out techniques such as soft x-ray emission spectroscopy (XES) is necessary due to their increased information depth (≈ 100-500 nm) compared to (photon-in/electron-out) photoemission spectroscopy.