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  Salis, E.; Gerber, A.; Andreasen, J.W.; Gevorgyan, S.A.; Betts, T.; Mihaylov, B.; Gottschalg, R.; Kodolbas, A.O.; Yilmaz, O.; Leidl, R.; Rennhofer, M.; Zamini, S.; Acciarri, M.; Binetti, S.; Lotter, E.; Bakker, K.; Kroon, J.; Soppe, W.; Razongles, G.; Mercaldo, L.V.; Roca, F.; Romano, A.; Hohl-Ebinger, J.; Warta, W.; Balenzategui, J.L.; Trigo, J.F.; Neubert, S.; Pavanello, D.; Müllejans, H.; Lauermann, I.: A European proficiency test on thin-film tandem photovoltaic devices. Progress in Photovoltaics 28 (2020), p. 1258-1276

10.1002/pip.3322
Open Access Version

Abstract:
A round-robin proficiency test (RR PT) on thin-film multi-junction (MJ) photovoltaic (PV) cells was run between 13 laboratories within the European project CHEETAH. Five encapsulated PV cells were circulated to participants for being tested at Standard Test Conditions (STC). Three cells were a-Si/μc-Si tandem PV devices, each of which had a different short-circuit current ratio between the top junction and the bottom one; the remaining two cells were single-junction PV devices made with material representative of the individual junctions in the MJ cells. The RR PT's main purpose was to assess the capability of the participating laboratories, in terms of employed facilities and procedures, to test MJ PV devices. Therefore, participants