Friedrich, F.; Mack, K.; Krishnan, N.; Kühnapfel, S.; Stannowski, B.; Schultz, Ch.; Schlatmann, R.; Boit, C.: Practical Considerations in Quantitative Dark and Illuminated Lock-In Thermography Analyses of Shunts in Silicon Thin-Film Modules. In: A. Mine ... [Ed.] : Proceedings / EU PVSEC 2013, 28th European Photovoltaic Solar Energy Conference and Exhibition, Parc des Expositions Paris Nord Villepinte, Paris, France, conference 30 September - 04 October 2013, exhibition 1- 3 October 2013 : the most inspiring platform for the global PV solar sector . München: WIP, 2013. - ISBN 3-936338-33-7
10.4229/28thEUPVSEC2013-3CV.1.35