Abou-Ras, D.; Dietrich, J.; Kavalakkatt, J.; Nichterwitz, M.; Schäfer, N.; Schmidt, S.S.; Schaffer, B.; Schaffer, M.; Koch, C.T.; Müller, M.M.; Bertram, F.; Christen, J.; Wilkinson, A.J.; Bauer, F.: Structure-property relationships in thin-film solar cells on multiple scales by correlative electron microscopy. In: Pavel Hozak [Ed.] : Proceedings of the 18th International Microscopy Conference (IMC2014), Prague, Czech. ISFM - CSMS, 2014. - ISBN 978-80-260-6721-4, p. MS-14-IN-2388/1