Bruker D8 Advance (WCRC)
X-Ray Diffractometer
Bruker D8 X-ray Diffractometer for Powder and Thin Film Analysis
The Bruker D8 X-ray diffractometer supports Bragg-Brentano, grazing incidence, and X-ray reflectivity (XRR) measurements. The instrument is equipped with a 9-position sample changer and an XYZ stage, and can be operated with a DOME for air-sensitive samples.
Selected Applications:- Bragg-Brentano XRD
- Grazing Incidence XRD with parallel beam geometry
- X-ray Reflectivity (XRR) measurements
- Dome for air-sensitive measurements
- 9-position automatic sample changer
For more details and current status of the Instrument please contact the Instrument Scientist.
Methods
Powder Diffraction, Thin film analysis, Phase analysis, Sonstige Diffraktion, X-ray reflectometry, SAXS, WAXS, Working area
The instrument can be used
by external users, by internal users, in cooperation with the organisational unit
Laboratories
Sample types
| Short description | Cu source, Lynxeye XE-T Detector, Motorized slits, D8 Two-circle goniometer with independent stepper motors and optical encoders |
| Usage | trained users |
| Building/room | 14.54 (EMIL) / 0009 |
| Location | 0009 |
| Additional information | SAX, WAXS, XRR, GIXRD |
| Instrument parameter | |
For more details and current status of the Instrument please contact the Instrument Scientist.