Bruker D8 Advance (WCRC)
X-Ray Diffractometer
Bruker D8 X-ray Diffractometer for Powder and Thin Film Analysis
The Bruker D8 X-ray diffractometer supports Bragg-Brentano, grazing incidence, and X-ray reflectivity (XRR) measurements. The instrument is equipped with a 9-position sample changer and an XYZ stage, and can be operated with a DOME for air-sensitive samples.
Selected Applications:- Bragg-Brentano XRD
- Grazing Incidence XRD with parallel beam geometry
- X-ray Reflectivity (XRR) measurements
- Dome for air-sensitive measurements
- 9-position automatic sample changer
For more details and current status of the Instrument please contact the Instrument Scientist.
Methods
X-ray reflectometry, Working area, Phase analysis, Sonstige Diffraktion, Powder Diffraction, Thin film analysis, SAXS, WAXS
The instrument can be used
by external users, by internal users, in cooperation with the organisational unit
Laboratories
Sample types
| Short description | Cu source, Lynxeye XE-T Detector, Motorized slits, D8 Two-circle goniometer with independent stepper motors and optical encoders |
| Usage | trained users |
| Building/room | 14.54 (EMIL) / 0009 |
| Location | 0009 |
| Additional information | SAX, WAXS, XRR, GIXRD |
| Instrument parameter | |
For more details and current status of the Instrument please contact the Instrument Scientist.