CoreLab CCMS (Correlative Microscopy and Spectroscopy)

Overview: Specimen preparation

Specimen preparation

The specimen preparation laboratory  is dedicated to prepare any material systems from various research areas for scanning as well as for transmission electron microscopy.

Overview: Focused Ion Beam

Focused Ion Beam

The Crossbeam combines the imaging and analytical performance of an scanning electron microscope with the ability for material processing and sample preparation with focused Galliumions. The capabilities including 3D nanotomography,  nanofabrication and lamellas for transmission electron microscopy .

The Orion NanoFab allows the creation of nanostructures lower 10 nm with helium or neon as well. The electron flood gun allows high-resolution images of poorly or non-conductive samples without previous coat to do with gold or carbon.

Overview: Scanning electron microscopy

Scanning electron microscopy

Four scanning electron microscopes are available which are equipped with various analysis options such as energy dispersive X-ray spectroscopy (EDX), electron backscatter diffraction (EBSD), electron beam induced current (EBIC), cathodoluminescence (CL) and atomic force microscope (AFM).

Overview: Transmission electron microscopy

Transmission electron microscopy

The two transmission electron allow a broad range of methods of high-resolution investigation, including scanning transmission electron microscope (STEM), electron energy loss spectroscopy (EELS), energy filtered transmission electron microscopy (EFTEM), energy dispersive X-ray spectroscopy (EDX) and tomography.

Overview: Focused Ion Beam

Orion NanoFab

The Orion NanoFab allows the creation of nanostructures lower 10 nm with helium or neon as well. The electron flood gun allows high-resolution images of poorly or non-conductive samples without previous coat to do with gold or carbon.