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CoreLab CCMS (Correlative Microscopy and Spectroscopy)
Welcome to the website of the CoreLab Correlative Microscopy and Spectroscopy (CCMS).
The CoreLab comprises various scanning electron and ion microscopes at the HZB sites in Wannsee (LMC) and Adlershof (WCRC). It is designed to support colleagues at HZB and external users from industry and research in their work and to collaborate with them in answering questions using electronic and ion microscopy techniques.
In order to optimally adapt the diverse investigation methods to the respective research projects, we ask you to contact us, i.e., the respective equipment managers, in advance.
Within the framework of scientific cooperation, it is generally possible to use the equipment independently after receiving instruction.
Interested parties from industry should also contact the respective equipment managers first.
Below you will find a brief overview of the possibilities offered by the CoreLab, along with some examples of applications. Please do not hesitate to contact us if you have any questions. Discussions often reveal previously unknown approaches to microstructural investigations.
Specimen preparation
Specimen preparation
The specimen preparation laboratory is dedicated to prepare any material systems from various research areas for scanning as well as for transmission electron microscopy.
Focused Ion Beam
Focused Ion Beam
The Crossbeam combines the imaging and analytical performance of an scanning electron microscope with the ability for material processing and sample preparation with focused Galliumions. The capabilities including 3D nanotomography, nanofabrication and lamellas for transmission electron microscopy .
The Orion NanoFab allows the creation of nanostructures lower 10 nm with helium or neon as well. The electron flood gun allows high-resolution images of poorly or non-conductive samples without previous coat to do with gold or carbon.
Scanning electron microscopy
Scanning electron microscopy
Four scanning electron microscopes are available which are equipped with various analysis options such as energy dispersive X-ray spectroscopy (EDX), electron backscatter diffraction (EBSD), electron beam induced current (EBIC), cathodoluminescence (CL) and atomic force microscope (AFM).
Transmission electron microscopy
Transmission electron microscopy
The two transmission electron allow a broad range of methods of high-resolution investigation, including scanning transmission electron microscope (STEM), electron energy loss spectroscopy (EELS), energy filtered transmission electron microscopy (EFTEM), energy dispersive X-ray spectroscopy (EDX) and tomography.
Orion NanoFab
Orion NanoFab
The Orion NanoFab allows the creation of nanostructures lower 10 nm with helium or neon as well. The electron flood gun allows high-resolution images of poorly or non-conductive samples without previous coat to do with gold or carbon.
