Method: AFM
Atomic force microscopy
| Instrument | Sample types | Laboratory assignment | Contact |
|---|---|---|---|
| AFM Digital Instruments, Nanoscope IIIa @ SCALA | SCALA | ||
| Photothermal AFM-IR | Multilayer/Film, Crystal | Labor Raum 123 Gebäude 19.2 | Karsten Hinrichs |
| AFM | Multilayer/Film, Amorphous, Crystal | AFM Ellipsometer Labor |