SEM Zeiss Merlin @Labor REM
scanning electron microscope
Methods
The instrument can be used
by external users
Laboratories
Sample types
Amorphous, Crystal, Multilayer/Film
| Short description | |
| Usage | |
| Building/room | 12.8 / 015 |
| Location | Adlershof |
| Additional information | |
| Instrument parameter | |
For more details and current status of the Instrument please contact the Instrument Scientist.