2 PANalytical MRD for texture analysis (LMC)
PANalytical MRD for texture analysis and µXRD
PANalytical X'Pert Pro MRD (materials research diffractometer) 4-axes X-ray diffractometer both for texture analysis as well as space-resolved X-ray diffraction of thin films.
» X-ray lens with point focus and parallel beam
- texture analysis (pole figures, orientation distribution functions (ODFs))
- in-plane X-ray diffraction
- temperature-dependent texture analysis from RT to 1100°C (Anton Paar DHS1100)
» Optional set-up I: Mono-capillary for µXRD
- space-resolved X-ray diffraction, e.g. for lateral mapping (focus width ≈ 120 µm)
» Optional set-up II: X-ray mirror with automatic beam attenuator
- grazing incidence XRD
- omega scans
- reflectometry
» Equipment
- Eulerian cradle (Omega, Phi, Psi)
- X-ray lens with adjustable cross slits
- 230 mm x 0.1 mm mono-capillary
- X-ray mirror with automatic beam attenuator
- Xe point detector
Methods
Texture, Micro-diffraction, Epitaxy
The instrument can be used
by external users, by internal users, in cooperation with the organisational unit
Laboratories
Sample types
| Short description | |
| Usage | |
| Building/room | LMC / PT005 |
| Location | |
| Additional information | |
| Instrument parameter | |