Method: Ellipsometry
Ellipsometry
| Instrument | Sample types | Laboratory assignment | Contact |
|---|---|---|---|
| IR polarimetry for in-situ spectroscopy | Multilayer/Film, Crystal, Liquid | in-Situ-Labor | Karsten Hinrichs
Andreas Furchner |
| IR polarimetry of thin films | Multilayer/Film, Crystal | in-Situ-Labor | Karsten Hinrichs
Andreas Furchner |
| UV-VIS-Ellipsometer | Multilayer/Film, Amorphous, Crystal, Liquid | AFM Ellipsometer Labor |
Andreas Furchner |
| IR Mueller-Matrix ellipsometry | Multilayer/Film, Amorphous, Crystal | Referenz-Labor | Andreas Furchner
Karsten Hinrichs |
| IR laser ellipsometry | Multilayer/Film, Amorphous, Crystal, Liquid | Labor Raum 142 Gebäude 19.2 | Andreas Furchner
Karsten Hinrichs |