IR polarimetry of thin films
IR polarimetry of thin films
Methods
Ellipsometry, Polarimetry, IR Spectroscopy, Thin film analysis
The instrument can be used
in cooperation with the organisational unit
Laboratories
Sample types
| Short description | |
| Usage | |
| Building/room | 19.2 / 121/122 |
| Location | Adlershof |
| Additional information | |
| Instrument parameter | |
For more details and current status of the Instrument please contact the Instrument Scientist.