IR laser ellipsometry
IR Laser ellipsometry
Methods
IR Spectroscopy, Thin film analysis, Ellipsometry, Polarimetry
The instrument can be used
in cooperation with the organisational unit
Laboratories
Sample types
Amorphous, Crystal, Liquid, Multilayer/Film
| Short description | |
| Usage | |
| Building/room | 19.2 / 142 |
| Location | Adlershof |
| Additional information | Purging with dry air
Box for sample storage is available. |
| Instrument parameter | |
For more details and current status of the Instrument please contact the Instrument Scientist.