XM - X-ray Microscopy
X-ray Microscopy
Methods
NEXAFS, EXAFS, X-ray Tomography, X-ray Microscopy, Fluorescence Imaging
Remote access
depends on experiment - please discuss with Instrument Scientist
| Beamline data | |
|---|---|
| Energy range | 180 - 1800 eV (soft X-ray range) & 700 - 2800 eV (tender X-ray range) |
| Energy resolution | up to 10000 |
| Flux | up to 4·1012 photons/sec @100 mA and 20 μm exit slit for cff = 2.25 directly after the exit slit |
| Polarisation | horizontal |
| Focus size (hor. x vert.) | 220 µm in exit slit |
| Phone | +49 30 8062 12110 |
| Weitere Details | U41-TXM |
| Station data | |
| TXM | |
| Temperature range | 100 K to room temperature |
| Pressure range | samples under vacuum |
| Detector | Thinned, backside illuminated CCD, 1340 pixel x 1300 pixel (Roper Scientific PI SX1300) |
| Manipulators | Goniometer - CompuStage (FEI) |
| Sample holder compatibility | Every FEI-CompuStage compatible holder could be used - but be careful: the sample holder orientation is rotated by 90° |
| Additional equipment | |
| Tomography capability | tilt range -80° to +80° |
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