HZB is member of the IGAFA initiative in Adlershof
What are the activities of IGAFA?
Since September 2020, the Helmholtz-Zentrum Berlin is again a member of IGAFA - the Initiative of Non-University Research Institutions in Adlershof. Prof. Dr. Jan Lüning, scientific director of the HZB, was elected to the association's board.
The tasks of IGAFA include the promotion of interdisciplinary cooperation, the promoting of scientific content through publications and events and the care of international guests in two meeting centers (see figure).
In addition, IGAFA sees itself as an interface between research and the public interested in science. For this reason, IGAFA participates, for example, in the Adlershof Dissertation Prize, the Long Night of Sciences, or supervises the Adlershof Ladies Network.
- Come along to the Long Night of Science on 6 June from 5 pm to midnightWhat does light reveal about materials? How are new medicines developed? And just how cold is liquid nitrogen? During the Long Night of Science, we’re opening our doors and inviting visitors on a journey of discovery through the world of research.
- Magnetic field during catalyst synthesis triples ammonia yieldApplying an external magnetic field during the synthesis of CoFe₂O₄ electrocatalysts triples the ammonia yield during electrocatalytic conversion. The magnetic field alters the surface states of the spinel oxide thin films, making catalytically active sites more accessible. In the journal 'Advanced Functional Materials', a team led by Marcel Risch at HZB and Sanjay Mathur at University of Cologne demonstrates a scalable strategy for developing next-generation electrocatalysts for efficient and sustainable chemical production.
- Imaging Ellipsometry for Process Control of Thin-Film DevicesA German–Israeli research team led by Dr. Andreas Furchner has demonstrated how imaging ellipsometry enables non-destructive characterisation and quality control of microstructured MXene thin films during device fabrication. The authors used two complementary ellipsometry approaches for precise, multi-scale access to key material properties. The work positions imaging ellipsometry as a powerful platform for monitoring thin-film uniformity, device integrity, and functionality throughout processing, including critical lithographic steps. The study was published in Applied Physics Letters and selected as an Editor’s Pick.