Meier, D.; Hartmann, G.; Völker, J.; Viefhaus, J.; Sick, B.: Reconstruction of offsets of an electron gun using deep learning and an optimization algorithm. In: Oleg Chubar, Kawal Sawhney [Ed.] : Advances in Computational Methods for X-Ray Optics V : 24 August - 4 September 2020, online only, United States Bellingham, Wash., USA: SPIE, 2020 (Proceedings of SPIE ; 11493). - ISBN 978-1-5106-3792-4, p. 114930E/1-7
10.1117/12.2568001
Open Access Version
