Söderström, J.; Agåker, M.; Liu, J.C.; Tokushima, T.; Ghosh, A.; Såthe, C.; Wang, J.; Koudouridis, A.P.F.; Grunwald-Delitz, M.; Baumann, T.M.; Meyer, M.; Harder, M.; Yin, Z.; Björneholm, O.; Nordgren, J.; Fritzsche, S.; Kimberg, V.; Rubensson, J.E.; Gelmukhanov, F.: Interference between One- and Two-Electron Channels in Resonant Inelastic X-Ray Scattering. Physical Review Letters 135 (2025), p. 233001/1-6
10.1103/c5mk-trlz
Open Accesn Version
Abstract:
Interference between scattering channels is observed in resonant inelastic x-ray scattering (RIXS) at the Ne K threshold. Final states with |2p-1np\rangle as the main configuration are populated via |s-1n'p\rangle resonances, where large-amplitude one-electron (n' = n) channels interfere with small-amplitude two-electron (n' not equal n) channels. The interference is manifested in an asymmetric line profile where the two-electron resonance occurs in the tail region of the one-electron resonance. In RIXS, this slowly varying tail plays the role of the continuum for the Fano effect. The asymmetric profile is well modeled by means of a single asymmetry parameter, determined by the amplitudes of the scattering channels and the energy separation between the resonances.