• Beyer, W.; Bergmann, J.; Breuer, U.; Finger, F.; Lambertz, A.; Merdzhanova, T.; Nickel, N.; Pennartr, F.; Schmidt, T.; Zastrow, U.: Comparison of Laser and oven annealing effects on hydrogen and microstructure in thin film silicon. In: Paul Stradins ... [Ed.] : Emerging silicon science and technology : April 6-10, 2015, San Francisco, California, USARed Hook, NY: Curran, 2015 ( Materials Research Society symposium proceedings : MRSSP ; 1770). - ISBN 978-1-5108-2626-7, p. 1-6

10.1557/opl.2015.431