AFM 1
Rasterkraftmikroskop
| Probenumgebung | |
|---|---|
| Probenbedingungen | solid film |
| Was passiert mit der Probe? | non-invasive technique |
| Was kann man messen? | |
| Was kann man messen? | Surface roughness, surface structure |
| Probenumgebung | |
|---|---|
| Probenbedingungen | solid film |
| Was passiert mit der Probe? | non-invasive technique |
| Was kann man messen? | |
| Was kann man messen? | Surface roughness, surface structure |