AFM 1
Atomic force microscope
| Sample environment | |
|---|---|
| Sample conditions | solid film |
| What happens to the sample? | non-invasive technique |
| What can be measured? | |
| What can be measured? | Surface roughness, surface structure |
| Sample environment | |
|---|---|
| Sample conditions | solid film |
| What happens to the sample? | non-invasive technique |
| What can be measured? | |
| What can be measured? | Surface roughness, surface structure |