AFM
Non-contact atomic force microscopy
Methods
The instrument can be used
in cooperation with the organisational unit
Laboratories
Sample types
Amorphous, Crystal, Multilayer/Film
| Short description | |
| Usage | |
| Building/room | 19.2 / 129 |
| Location | Adlershof |
| Additional information | max. area: 45 µm x 45 µm |
| Instrument parameter | |
For more details and current status of the Instrument please contact the Instrument Scientist.