IR Mueller-Matrix ellipsometry
Infrared Mueller-Matrix Ellipsometer
Methods
Ellipsometry, Polarimetry, IR Spectroscopy, Thin film analysis
The instrument can be used
in cooperation with the organisational unit
Laboratories
Sample types
Amorphous, Crystal, Multilayer/Film
| Spectral range | |
|---|---|
| Short description | 800 - 8000 wavenumbers |
| Usage | |
| Building/room | 19.2 / 140/141 |
| Location | Adlershof |
| Additional information | Purging with dry air
Box for sample storage is available. |
| Instrument parameter | |
For more details and current status of the Instrument please contact the Instrument Scientist.