LEEM-PEEM
LEEM-PEEM
This photoemission electron microscope is equipped with a new state-of-the-art aberration corrector minimizing electron-optical imperfections and thus, allowing for higher instrument transmission. Simultaneously, better spatial resolution down to 2 nm is achieved as demonstrated in the low-energy (LEEM) mode. In combination with soft x-rays (XPEEM), spatially resolved spectroscopic investigations (NEXAFS, XPS) can be carried out as well as magnetic spectroscopies (XMCD, XMLD). An extension allows performing stroboscopic XPEEM experiments for magnetization dynamics.
Methods
PEEM, X-ray Microscopy, NEXAFS, XMCD
Remote access
not possible
| Station data | |
|---|---|
| Temperature range | 300 - 1600 K |
| Pressure range | 4·10-10 - 1·10-7 mbar |
| Detector | two-stage MCP (Hamamatsu) |
| Manipulators | 5-Axis Piezo-contolled |
| Sample holder compatibility | special SPECS
samples 9mm |
| Additional equipment | |
| Spatial resolution LEEM-mode | 2 nm |
| Spatial resolution PEEM-mode | 20 nm |
| base pressure | 4E-10 mbar |
| Preparation chamber | * Sputtering up to 1.5kV * Sample temp. range 300 - 1200 K * pyrometric temp. measurement * LEED * Auger * gas inlets: Ar, O2, user specific * base pressure 1E-10 mbar |
Combined Low-Energy- / Photoemission-Electron-Microscope with aberration correction.
For more details, please contact Stefan Cramm "s.cramm (at) fz-juelich.de".
This microscope is equipped with a new state-of-the-art aberration corrector minimizing electron-optical imperfections, allowing for higher instrument transmission and simultaneously better spatial resolution. In LEEM-Mode, 2 nm have been demonstrated recently. In combination with soft x-rays (XPEEM), spatially-resolved spectroscopic investigations can be carried out (NEXAFS, XPS) as well as magnetic spectroscopies (XMCD,XMLD). A recently installed extension allows to perform stroboscopic XPEEM experiments for magnetization dynamics.