Chen, Y.-Y.; Hsin, P.-Y.; Leendertz, C.; Korte, L.; Rech, B.; Du, C.-H.; Gan, J.-Y.: Field-effect passivation and degradation analyzed with photoconductance decay measurements. Applied Physics Letters 104 (2014), p. 193504/1-5
10.1063/1.4876126

Abstract:
In this article, an expression for the surface passivation has been derived in terms of the surface recombination velocity and the field-effect exponential. The analytical solutions provide a comprehensive understanding of the injection dependency of minority charge carrier lifetime as measured by photoconductance decay. The model has been utilized to analyze the field-effect passivation of silicon exerted by the fixed dielectric charge in an overlying dielectric film. Possible limitations and restrictions of the technique are also addressed.