• Gref, O.; Teodoreanu, A.; Leihkauf, R.; Lohrke, H.; Kittler, M.; Amkreutz, D.; Boit, C.; Friedrich, F.: Grain boundary light beam induced current: A characterization of bonded silicon wafers and polycrystalline silicon thin films for diffusion length extraction. Physica Status Solidi A 213 (2016), p. 1728-1737

10.1002/pssa.201532987