Beyer, W.; Hilgers, W.; Lennartz, D.; Maier, F.; Nickel, N.; Pennartz, F.; Prunici, P.: Effect of annealing on microstructure in (doped and undoped) hydrogenated amorphous silicon films. In: P. Stradins ... [Ed.] : Film-silicon science and technology : April 21 - 25, 2014, San Francisco, California, USA ; [2014 MRS spring meeting ; Symposium A - Film-Silicon Science and Technology]. Red Hook, NY: Curran, 2014 ( Materials Research Society symposium proceedings : MRSSP ; 1660). - ISBN 978-1-5108-0527-9
10.1557/opl.2014.667