Publications 2018


Dziarzhytski, S.; Siewert, F.; Sokolov, A.; Gwalt, G.; Seliger, T.; Rübhausen, M.; Weigelt, H.; Brenner, G.: Diffraction gratings metrology and ray-tracing results for an XUV Raman spectrometer at FLASH. Journal of Synchrotron Radiation 25 (2018), p. 138-144
doi:10.1107/S1600577517013066
Open Access Version


Erk, B.; Müller, J.P.; Bomme, C.; Boll, R.; Brenner, G.; Chapman, H.; Correa, J.; Düsterer, S.; Dziarzhytski, S.; Eisebitt, S.; Graafsma, H.; Grunewald, S.; Gumprecht, L.; Hartmann, R.; Hauser, G.; Keitel, B.; von Korff Schmising, C.; Kuhlmann, M.; Manschwetus, B.; Mercadier, L.; Müller, E.; Passow, Christopher.; Ploenjes, E.; Ramm, D.; Rompotis, D.; Rudenko, A.; Rupp, D.; Sauppe, M.; Siewert, F.; Schlosser, D.; Strüder, L.; Swiderski, A.; Techert, S.; Tiedtke, K.; Tilp, T.; Treusch, R.; Schlichting, I.; Ullrich, J.; Moshammer, R.; Möller, T.; Rolles, D.: CAMP@FLASH - An End-Station for Imaging, Electron-and Ion-Spectroscopy, and Pump-Probe Experiments at the FLASH Free-Electron Laser. Journal of Synchrotron Radiation 25 (2018), p. 1529-1540
doi:10.1107/S1600577518008585
Open Access Version


Grundmann, S.; Trinter, F.; Bray, A.W.; Eckart, S.; Rist, J.; Kastirke, G.; Metz, D.; Klumpp, S.; Viefhaus, J.; Schmidt, L. Ph. H.; Williams, J.B.; Dörner, R.; Jahnke, T.; Schöffler, M.S.; Kheifets, A.: Separating Dipole and Quadrupole Contributions to Single-Photon Double Ionization. Physical Review Letters 121 (2018), p. 173003/1-5
doi:10.1103/PhysRevLett.121.173003


Guttmann, P.; Werner, S.; Siewert, F.; Sokolov, A.; Schmidt, J.-S.; Mast, M.; Brzhezinskaya, M.; Jung, C.; Follath, R.; Schneider, G.: The New HZB X-Ray Microscopy Beamline U41-PGM1-XM at BESSY II. Microscopy and Microanalysis 24 (2018), p. 204-205
doi:10.1017/S1431927618013375
Open Access Version


Jansing, C.; Wahab, H.; Timmers, H.; Gaupp, A.; Mertins, H.: Soft X-ray refractive index by reconciling total electron yield with specular reflection: experimental determination of the optical constants of graphite. Journal of Synchrotron Radiation 25 (2018), p. 1433-1443
doi:10.1107/S1600577518010408


Krzywinski, J.; Conley, R.; Moeller, S.; Gwalt, G.; Siewert, F.; Waberski, C.; Zeschke, T.; Cocco, D.: Damage thresholds for blaze diffraction gratings and grazing incidence optics at an X-ray free-electron laser. Journal of Synchrotron Radiation 25 (2018), p. 85-90
doi:10.1107/S1600577517016083
Open Access Version


Makhotkin, I.; Milov, I.; Chalopsky, J.; Tiedtke, K.; Enkisch, H.; se Vries, G.; Scholze, F.; Siewert, F.; Sturm, J.; Nicolaev, K.; van de Kruijs, R.; Smithers, M.; van Wolferen, H.; Keim, E.; Louis, E.; Jacyna, I.; Jurek, M.; Klinger, D.; Pelka, J.; Juha, L.; Hajkova, V.; Vozda, V.; Burian, T.; Saksl, K.; Faatz, B.; Keitel, B.; Plönjes, E.; Schreiber, S.; Toleikis, S.; Loch, R.; Hermann, M.; Strobel, S.; Donker, R.; Mey, T.; Sobierajski, R.: Damage accumulation in thin ruthenium films induced by repetitive exposure to femtosecond XUV pulses below the single-shot ablation threshold. Journal of the Optical Society of America / B 35 (2018), p. 2799-2805
doi:10.1364/JOSAB.35.002799
Open Access Version


Makhotkin, I.A.; Sobierajski, R.; Chalupsky, J.; Tiedtke, K.; de Vries, G.; Störmer, M.; Scholze, F.; Siewert, F.; van de Kruijs, R.W. E.; Milov, I.; Louis, E.; Jacyna, I.; Jurek, M.; Klinger, D.; Nittler, La.; Syryanyy, Y.; Juha, L.; Hajkova, V.; Vozda, V.; Burian, T.; Saksl, K.; Faatz, B.; Keitel, B.; Plönjes, E.; Schreiber, S.; Toleikis, S.; Loch, R.; Hermann, M.; Strobel, S.; Nienhuys, H.-K.; Gwalt, G.; Mey, T.; Enkisch, H.: Experimental study of EUV mirror radiation damage resistance under long-term free-electron laser exposures below the single-shot damage threshold. Journal of Synchrotron Radiation 25 (2018), p. 77-84
doi:10.1107/S1600577517017362
Open Access Version


Mertins, H.-Ch.; Jansing, C.; Krivenkov, M.; Varykhalov, A.; Rader, O.; Wahab, H.; Timmers, H.; Gaupp, A.; Sokolov, A.; Tesch, M.; Oppeneer, P. M.: Giant magneto-optical Faraday effect of graphene on Co in the soft x-ray range. Physical Review B 98 (2018), p. 064408/1-9
doi:10.1103/PhysRevB.98.064408


Milov, I.; Makhotkin, I.A.; Sobierajski, R.; Medvedev, N.; Lipp, V.; Chalupsky, J.; Sturm, J.M.; Tiedtke, K.; de Vries, G.; Störmer, M.; Siewert, F.; van de Kruijs, R.; Louis, E.; Jacyna, I.; Jurek, M.; Juha, L.; Hajkova, V.; Vozda, V.; Burian, T.; Saksl, K.l; Faatz, B.; Keitel, B.; Ploenjes, E.; Schreiber, S.; Toleikis, S.; Loch, R.; Hermann, M.; Strobel, S.; Nienhuys, H.-K.; Gwalt, G.; Mey, T.; Enkisch, H.; Bijkerk, F.: Mechanism of single-shot damage of Ru thin films irradiated by femtosecond extreme UV free-electron laser. Optics Express 26 (2018), p. 19665-19684
doi:10.1364/OE.26.019665
Open Access Version


Müller, A.; Borovik, A.; Buhr, T.; Hellhund, J.; Holste, K.; Kilcoyne, A.; Klumpp, S.; Martins, M.; Ricz, S.; Viefhaus, J.; Schippers, S.: Near-K-edge single, double, and triple photoionization of C+ ions. Physical Review A 97 (2018), p. 013409/1-14
doi:10.1103/PhysRevA.97.013409


Müller, A.; Lindroth, E.; Bari, S.; Borovik, A.; Hillenbrand, P.; Holste, K.; Indelicato, P.; Kilcoyne, A.; Klumpp, S.; Martins, M.; Viefhaus, J.; Wilhelm, P.; Schippers, S.: Photoionization of metastable heliumlike C4+ (1s2s 3S1) ions: Precision study of intermediate doubly excited states. Physical Review A 98 (2018), p. 033416/1-16
doi:10.1103/PhysRevA.98.033416


Siewert, F.; Löchel, B.; Buchheim, J.; Eggenstein, F.; Firsov, A.; Gwalt, G.; Kutz, O.; Lemke, S.; Nelles, B.; Rudolph, I.; Schäfers, F.; Seliger, T.; Senf, F.; Sokolov, A.; Waberski, C.; Wolf, J.; Zeschke, T.; Zizak, I.; Follath, R.; Arnold, T.; Frost, F.; Pietag, F.; Erko, A.: Gratings for synchrotron and FEL beamlines: a project for the manufacture of ultra-precise gratings at Helmholtz Zentrum Berlin. Journal of Synchrotron Radiation 25 (2018), p. 91-99
doi:10.1107/S1600577517015600
Open Access Version


Störmer, M.; Siewert, F.; Horstmann, C.; Buchheim, J.; Gwalt, G.: Coatings for FEL optics: preparation and characterization of B4C and Pt. Journal of Synchrotron Radiation 25 (2018), p. 116-122
doi:10.1107/S1600577517016095
Open Access Version


Wen, M.; Kozhevnikov, I.V.; Siewert, F.; Buzmakov, A.V.; Xie, C.; Huang, Q.; Wang, Z.; Samoylova, L.; Sinn, H.: Effect of the surface roughness on X-ray absorption by mirrors operating at extremely small grazing angles. Optics Express 26 (2018), p. 21003-21018
doi:10.1364/OE.26.021003
Open Access Version


Yin, Z.; Löchel, H.; Rehanek, J.; Goy, C.; Kalinin, A.; Schottelius, A.; Trinter, F.; Miedema, P.; Jain, A.; Valerio, J.; Busse, P.; Lehmkühler, F.; Möller, J.; Grübel, G.; Madsen, A.; Viefhaus, J.; Grisenti, R.; Beye, M.; Erko, A.; Techert, S.: X-ray spectroscopy with variable line spacing based on reflection zone plate optics. Optics Letters 43 (2018), p. 4390-4393
doi:10.1364/OL.43.004390