Publications 2011


Schulz, J.; Lemke, S.; Mohr, J.; Voigt, A.; Walter, M.; Worgull, M.: LIGA - Neues von Tiefenlithographie und Abformung. In: Proceedings / Mikrosystemtechnik-Kongress 2011 : 10. - 12. Oktober 2011, Darmstadt. 1 CD-ROM. Berlin: VDE-Verl., 2011. - ISBN 978-3-8007-3367-5, p. 142-145


Barber, S.K.; Geckeler, R.D.; Yashchuk, V.V.; Gubarev, M.V.; Buchheim, J.; Siewert, F.; Zeschke, T.: Optimal alignment of mirror-based pentaprisms for scanning deflectometric devices. Optical Engineering 50 (2011), p. 073602/1-8


Barber, S.K.; Morrison, G.Y.; Yashchuk, V.V.; Gubarev, M.V.; Geckeler, R.D.; Buchheim, J.; Siewert, F.; Zeschke, T.: Developmental long-trace profiler using optimally aligned mirror-based pentaprism. Optical Engineering 50 (2011), p. 053601/1-10


Bischoff, J.; Senn, T.; Löchel, B.: Prozessoptimierung zur Herstellung von zweidimensionalen photonischen Kristallen mittels Nanoimprint Lithografie. In: Mikro-Nano-Integration : Beiträge des 3. GMM-Workshops, 3. - 4. März 2011 in Stuttgart. 1 CD-ROM. Berlin: VDE-Verl., 2011. - ISBN 978-3-8007-3334-7, p. 68-72


Brenner, G.; Kapitzki, S.; Kuhlmann, M.; Ploenjes, E.; Noll, T.; Siewert, F.; Treusch, R.; Tiedtke, K.; Reininger, R.; Roper, M.D.; Bowler, M.A.; Quinn, F.M.; Feldhaus, J.: First results from the online variable line spacing grating spectrometer at FLASH. Nuclear Instruments & Methods in Physics Research A 635 (2011), p. S99-S103
doi:10.1016/j.nima.2010.09.134


Dietsch, R.; Rack, A.; Weitkamp, T.; Riotte, W.; Rack, T.; Holz, T.; Krämer, M.; Weissbach, D.; Morawe, Ch.; Siewert, F.; Meduna, M.; Cloetens, : Performance of Multilayer Monochromators for Hard X-Ray Imaging with Coherent Synchrotron Radiation. In: McNulty, I. [u.a.] [Eds.] : The 10th International Conference on X-Ray Microscopy. Woodbury, NY: AIP Press, 2011 (AIP Conference Proceedings ; 1365). - ISBN 978-0-7354-0925-5, p. 77 - 80


Döring, S.; Schönbohm, F.; Berges, U.; Schreiber, R.; Bürgler, D.E.; Schneider, C.M.; Gorgoi, M.; Schäfers, F.; Papp, C.; Balke, B.; Fadley, C.S.; Westphal, C.: Hard x-ray photoemission studies using standing-wave excitation applied to the MgO/Fe interface. Physical Review B 83 (2011), p. 165444/1-9


Epishin, Alexander; Link, Thomas; Ulbricht, Alexander; Zizak, Ivo; Bansal, Mamta: Synchrotron measurement of the 3D shape of X-ray reflections from the γ/γ '-microstructure of nickel-base superalloys. International Journal of Materials Research 102 (2011), p. 1452-1458
doi:10.3139/146.110617


Faatz, B.; Baboi, N.; Ayvazyan, V.; Balandin, V.; Decking, W.; Duesterer, S.; Eckoldt, H. -J.; Feldhaus, J.; Golubeva, N.; Honkavaara, K.; Koerfer, M.; Laarmann, T.; Leuschner, A.; Lilje, L.; Limberg, T.; Noelle, D.; Obier, F.; Petrov, A.; Ploenjes, E.; Rehlich, K.; Schlarb, H.; Schmidt, B.; Schmitz, M.; Schreiber, S.; Schulte-Schrepping, H.; Spengler, J.; Staack, M.; Tavella, F.; Tiedtke, K.; Tischer, M.; Treusch, R.; Vogt, M.; Willner, A.; Bahrdt, J.; Follath, R.; Gensch, M.; Holldack, K.; Meseck, A.; Mitzner, R.; Drescher, M.; Miltchev, V.; Roensch-Schulenburg, J.; Rossbach, J.: Flash II: Perspectives and challenges. Nuclear Instruments & Methods in Physics Research A 635 (2011), p. S2-S5
doi:10.1016/j.nima.2010.10.065
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Fauquet C.; Dehlinger, M.; Jandard, F.; Ferrero, S.; Pailharey, D.; Larcheri, S.; Graziola, R.; Purans, J.; Bjeoumikhov, A.; Erko, A.; Zizak, I.; Dahmani, B.; Tonneau, D.: Combining scanning probe microscopy and x-ray spectroscopy. NANOSCALE RESEARCH LETTERS 6 (2011), p. 308/1-6


Grigorian, S.; Tranchida, D.; Ksenzov, D.; Schäfers, F.; Schönherr, H.; Pietsch, U.: Structural and morphological changes of P3HT films in the planar geometry of an OFET device under an applied electric field. European Polymer Journal 47 (2011), p. 2189 - 2196
doi:10.1016/j.eurpolymj.2011.09.003


Günther, C.M.; Pfau, B.; Mitzner, R.; Siemer, B.; Roling, S.; Zacharias, H.; Kutz, O.; Rudolph, I.; Schondelmaier, D.; Treusch, R.; Eisebitt, S.: Sequential femtosecond X-ray imaging. Nature Photonics 5 (2011), p. 99-102
doi:10.1038/NPHOTON.2010.287


Jimenez, C.; Garcia-Moreno, F.; Pfretzschner, B.; Klaus, M.; Wollgarten, M.; Zizak, I.; Schumacher, G.; Tovar, M.; Banhart, J.: Decomposition of TiH2 studied in situ by synchrotron X-ray and neutron diffraction. Acta Materialia 59 (2011), p. 6318-6330
doi:10.1016/j.actamat.2011.06.042


Kordyuk, A.A.; Zabolotnyy, V.B.; Evtushinsky, D.V.; Kim, T.K.; Morozov, I.V.; Kulic, M.L.; Follath, R.; Behr, G.; Büchner, B.; Borisenko, S.V.: Angle-resolved photoemission spectroscopy of superconducting LiFeAs: Evidence for strong electron-phonon coupling. Physical Review B 83 (2011), p. 134513/1-6
doi:10.1103/PhysRevB.83.134513
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Krempaský, J.; Follath, R.; Strocov, V.N.; Schmitt, T.; Flechsig, U.: Heydemann interpolation correction for energy linearization of soft X-ray monochromators. In: Morawe, C. [u.a.] [Eds.] : Advances in x-ray/EUV optics and components VI : 22 - 24 August 2011, San Diego, California, United States. Bellingham, Wash.: SPIE, 2011 (Proceedings of SPIE ; 8139). - ISBN 978-0-8194-8749-0, p. 81390K/1-5


Ksenzov, D.; Schlemper, Ch.; Davtyan, A.; Bajt, S.; Schäfers, F.; Pietsch, U.: A setup for probing ultra-short soft X-ray diffraction by means of curved multilayer structures. Nuclear Instruments and Methods in Physics Research B 269 (2011), p. 2124-2129


Massee, F.; de Jong, S.; Huang, Y.; Siu, W. K.; Santoso, I.; Mans, A.; Boothroyd, A. T.; Prabhakaran, D.; Follath, R.; Varykhalov, A.; Patthey, L.; Shi, M.; Goedkoop, J. B.; Golden, M. S.: Bilayer manganites reveal polarons in the midst of a metallic breakdown. Nature Physics 7 (2011), p. 978-982
doi:10.1038/NPHYS2089
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Rehanek, J.; Schäfers, F.; Scheer, M.; Erko, A.; Scheer, M.; Freund, W.; Grünert, J.; Ozkan, C.; Molodtsov, S.: Simulations of diagnostic spectrometers for the European XFEL using the ray-trace tool RAY. In: Sanchez del Rio, M. [u.a.] [Eds.] : Advances in computational methods for X-ray optics II : 21 - 24 August 2011, San Diego, California, United States. Bellingham, Wash.: SPIE, 2011 (Proceedings of SPIE ; 8141). - ISBN 978-0-8194-8751-3, p. 814109/1-15


Schoengen, M.; Nüsse, N.; Probst, J. Kronast, F.; Barth, M.; Wolters, J.; Löchel, B.; Benson, O.: Einbettung von plasmonischen Elementen in photonische Kristall-Resonatoren für Licht-Materiekopplung. In: Proceedings / Mikrosystemtechnik-Kongress 2011 : 10. - 12. Oktober 2011, Darmstadt. 1 CD-ROM. Berlin: VDE-Verl., 2011. - ISBN 978-3-8007-3367-5, p. 102-105


Schönfeld, M.; Saupe, J.; Vogel, J.; Aßmann, H.; Cappek, M.; Lemke, S.; Löchel, B.; Grimm, J.: Experimentelle Untersuchung und theoretische Betrachtung zur gravimetrisch kontrollierten IR-Trocknung dicker SU-8-Schichten. In: Proceedings / Mikrosystemtechnik-Kongress 2011 : 10. - 12. Oktober 2011, Darmstadt. 1 CD-ROM. Berlin: VDE-Verl., 2011. - ISBN 978-3-8007-3367-5, p. 543-546


Senn, T.; Bischoff, J.; Nüsse, N.; Schoengen, M.; Löchel, B.: Fabrication of photonic crystals for applications in the visible range by Nanoimprint Lithography. Photonics and Nanostructures - Fundamentals and Applications 9 (2011), p. 248-254
doi:10.1016/j.photonics.2011.04.007


Senn, T.; Esquivel, J.P.; Sabaté, N.; Löchel, B.: Fabrication of high aspect ratio nanostructures on 3D surfaces. Microelectronic Engineering 88 (2011), p. 3043-3048


Senn, T.; Kutz, O.; Weniger, Ch.; Li, J.; Schoengen, M.; Löchel, H.; Wolf, J.; Göttert, P.; Löchel, B.: Integration of moth-eye structures into a poly(dimethylsiloxane) stamp for the replication of functionalized microlenses using UV-nanoimprint lithography. Journal of Vacuum Science and Technology B 29 (2011), p. 061601/1-5
doi:10.1116/1.3644474


Seregin, A.Yu.; Makhotkin, I.A.; Yakunin, S.N.; Erko, A.I.; Tereshchenko, E.Yu.; Shaitura, D.S.; Chikina, E.A.; Tsetlin, M.B.; Mikheeva, M.N.; Ol'shanskii, E.D.: Investigation of the thermal diffusion during the formation of a quasicrystalline phase in thin Al-Pd-Re films. Crystallography Reports 56 (2011), p. 497-501
doi:10.1134/S106377451103028X


Siewert, F.; Buchheim, J.; Zeschke, T.; Brenner, G.; Kapitzki, S.; Tiedtke, K.: Sub-nm accuracy metrology for ultra-precise reflective X-ray optics. Nuclear Instruments & Methods in Physics Research A 635 (2011), p. S52 - S57
doi:10.1016/j.nima.2010.10.137


Störmer, M.; Siewert, F.; Gaudin, J.: Development of x-ray optics for advanced research light sources. In: Tschentscher. T. [u.a.] [Eds.] : Advances in x-ray free-electron lasers: radiation schemes, x-ray optics, and instrumentation : 20 - 21 April 2011, Prague, Czech Republic. Bellingham, Wash.: SPIE, 2011 (Proceedings of SPIE ; 8078). - ISBN 978-0-8194-8668-4, p. 80780G/1-8


Sun, G.; Hovestaedt, M.; Zhang, X.; Hinrichs, K.; Rosu, D.M.; Lauermann, I.; Zielke, C.; Vollmer, A.; Loechel, H.; Ay, B.; Holzhuetter, H.-G.; Schade, U.; Esser, N.; Volkmer, R.; Rappich, J.: Infrared spectroscopic ellipsometry (IRSE) and X-ray photoelectron spectroscopy (XPS) monitoring the preparation of maleimide-functionalized surfaces: from Au towards Si (111). Surface and Interface Analysis 43 (2011), p. 1203-1210
doi:10.1002/sia.3699


Svarcova, S.; Bezdicka, P.; Hradil, D.; Hradilova, J.; Zizak, I.: Clay pigment structure characterisation as a guide for provenance determination-a comparison between laboratory powder micro-XRD and synchrotron radiation XRD. Analytical and Bioanalytical Chemistry 399 (2011), p. 331-336
doi:10.1007/s00216-010-4382-4


Tavella, F.; Adams, D.; Ayvazyan, V.; ..Bahrdt, J.; ..Follath, R.; Gensch, M.;..Holldack, K.;...Meseck, A.;...Mitzner, R; ...: High Repetition Rate mJ-level Few-Cycle Pulse Laser Amplifier for XUV-FEL seeding. In: High Intensity Lasers and High Field Phenomena (HILAS), Istanbul, Turkey. February 16, 2011. , 2011, p. [1-3]


Thirupathaiah, S.; Rienks, E.D.L.; Jeevan, H.S.; Ovsyannikov, R.; Slooten, E.; Kaas, J.; van Heumen, E.; de Jong, S.; Dürr, H.A.; Siemensmeyer, K.; Follath, R.; Gegenwart, P.; Golden, M.S.; Fink, J.: Dissimilarities between the electronic structure of chemically doped and chemically pressurized iron pnictides from an angle-resolved photoemission spectroscopy study. Physical Review B 84 (2011), p. 014531/1-7
doi:10.1103/PhysRevB.84.014531
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Trushin, M.; Vyvenko, O.; Seifert, W.; Klossek, A.; Zizak, I.; Kittler, M.: Scanning X-ray Excited Optical Luminescence Microscopy as a New Tool for the Analysis of Recombination Active Defects in Multi-Crystalline Silicon. Solid State Phenomena 178-179 (2011), p. 301-306
doi:10.4028/www.scientific.net/SSP.178-179.301


Valencia, S.; Crassous, A.; Bocher, L.; Garcia, V.; Moya, X.; Cherifi, R.O.; Deranlot, C.; Bouzehouane, K.; Fusil, S.; Zobelli, A.; Gloter, A.; Mathur, N.D.; Gaupp, A.; Abrudan, R.; Radu, F.; Barthelemy, A.; Bibes, M.: Interface-induced room-temperature multiferroicity in BaTiO3. Nature Materials 10 (2011), p. 753-758
doi:10.1038/NMAT3098
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Valencia, S.; Konstantinovic, Z.; Gaupp, A.; Schmitz, D.; Balcells, L.; Martinez, B.: Interfacial effects in La2/3Sr1/3MnO3 thin films with different complex oxide capping layers. Journal of Applied Physics 109 (2011), p. 07D718/1-3
doi:10.1063/1.3545814
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Valencia, S.; Konstantinovic, Z.; Schmitz, D.; Gaupp, A.; Balcells, L.; Martinez, B.: Interfacial effects in manganite thin films with different capping layers of interest for spintronic applications. Physical Review B 84 (2011), p. 024413/1-7
doi:10.1103/PhysRevB.84.024413
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Wang, C.; Neugebauer, U.; Bürck, J.; Myllykoski, M.; Baumgärtel, P.; Popp, J.; Kursula, P.: Charge Isomers of Myelin Basic Protein: Structure and Interactions with Membranes, Nucleotide Analogues, and Calmodulin. PLoS One 6 (2011), p. e19915/1-15
doi:10.1371/journal.pone.0019915


Wiegmann, A.; Stavridis, M.; Walzel, M.; Siewert, F.; Zeschke, T.; Schulz, M.; Elster, C.: Accuracy evaluation for sub-aperture interferometry measurements of a synchrotron mirror using virtual experiments. Precision Engineering 35 (2011), p. 183-190


Yashchuk, V.V.; Takacs, P.Z.; McKinney, W.R.; Assoufid, L.; Siewert, F.; Zeschke, T.: Development of a new generation of optical slope measuring profiler. Nuclear Instruments & Methods in Physics Research A 649 (2011), p. 153-155
doi:10.1016/j.nima.2010.10.063