Method: THz-near-field Microscopy
THz-near-field Microscopy
Station | Energy Range | Polarisation | Beamline | Contact |
---|---|---|---|---|
IR-Spectroscopy and Microscopy | .0006 - 1 eV | linearly horizontal/vertical | IRIS | Ulrich Schade
Ljiljana Puskar |
.0006 - 1 eV | linearly horizontal/vertical | IRIS 2 |