BAMline

BAMline

The first hard x-ray beamline at BESSY II has been installed at a superconducting 7 T wavelength shifter. The main optical elements of the beamline are a double-multilayer monochromator (DMM) and a double-crystal monochromator (DCM). Depending on the application, the two devices are used separately or in-line. The main applications of the monochromatic radiation with photon energies up to 60 keV are x-ray fluorescence analysis, micro computed tomography, x-ray topography, detector calibration and reflectometry. Depending on the requirements, the used beam size varies between 1.5µm and 10mm.

Beamline data
Segment L02
Location (Pillar) 3.2
Source 7T-WLS-1 (Wavelength Shifter, critical energy 13.5 keV at 1.7 GeV electron energy)
Monochromator Double Multilayer Monochromator (DMM) and/or Double Crystal Monochromator (DCM)
Energy range 8 keV - 60 keV
Energy resolution
  • DCM: ~0.01%,
  • DMM: ~1.5%, ~4%, pink beam
Flux
  • DCM (Si111): 5.5E+8 @14 keV, 3.5E+8 @30 keV;
  • DMM: 8.0E+10 @20 keV, 4.0E+10 @40 keV;
units: s^-1 x mm^-2
Polarisation horizontal
Divergence horizontal 5 mrad
Divergence vertical 1 mrad
Focus size (hor. x vert.) DMM: vert. 0.15 mm between 35 m and 45 m from source; DCM: hor. 0.25 mm at 37 m from source
User endstation contact the Instrument Scientist
Distance Focus/last valve 1000 - 10000 mm
Height Focus/floor level 1400-1465 mm
Beam availability 24h/d
Phone +49 30 8104 5576
Applicable station(s)
BAMline Spectroscopy room temperature
BAMline Imaging room temperature - 1100°C

The BAMline is specialized for nondestructive material characterization using different methods. The main applications of the monochromatic radiation with photon energies up to 60 keV are x-ray fluorescence analysis at BAMline Spectroscopy, micro computed tomography, x-ray topography, detector calibration and reflectometry at BAMline Imaging. Calculable undispersed radiation up to 200 keV is available for radiometric applications. Depending on the requirements the used beam size varies between 1.5 and 10000µm.

For further information please see BAMline Imaging and BAMline Spectroscopy or contact martin.radtke@bam.de (EXAFS, XANES, XRF), henning.markoetter@bam.de (SXCT), bernd.mueller@bam.de (SXRR/SXRCT).