Method: X-ray Microscopy
X-ray Microscopy
| Station | Energy Range | Polarisation | Beamline | Contact |
|---|---|---|---|---|
| LEEM-PEEM | 55 - 1500 eV | • horizontal • vertical • circular | UE56-1_SGM | Stefan Cramm
Tomas Duchon |
| MAXYMUS | 200 - 1900 eV | Horizontal, Vertical, Circular positive, Circular negative | UE46_MAXYMUS | Markus Weigand
Sebastian Wintz Michael Bechtel |
| SMART | 100 - 1800 eV | variable (linear and circular) | UE49_PGM SMART | Thomas Schmidt
Marcel Springer |
| SPEEM | 100 - 1800 eV | variable | UE49_PGM SPEEM | Florian Kronast
Sergio Valencia Molina Mohamad Assaad Mawass |
| XM - X-ray Microscopy | 250 - 2800 eV | horizontal | U41-TXM | Peter Guttmann
Stephan Werner |