POLARIMETER
Polarimetry
The POLARIMETER is a versatile UHV-polarimeter for the EUV XUV spectral range which incorporates two optical elements: a phase retarder and a reflection analyzer. Both optics are azimuthally rotatable around the incident synchrotron radiation beam and the incidence angle is freely selectable. This allows for a variety of reflectometry, polarimetry and ellipsometry applications on magnetic or non-magnetic samples and multilayer optical elements.
Selected Applications:- Development of ML-optics for Polarisation Steering and Control
- Full control of Stokes vector (S1, S2, S3) in XUV-range (<1000 eV)
- Complete at-wavelength characterisation of multilayer optics
- Measurement of complex reflection or transmission coefficients (Amplitudes and Phases)
- Polarisation Spectroscopy - Magneto-optics - XMCD, XMLD, T,L-MOKE, Faraday-, Kerr-effect
Methods
Reflectivity, NEXAFS, XRF, XMCD, Ellipsometry, Polarimetry, Reflectometry
Remote access
not possible
| Beamline data | |
|---|---|
| Energy range | 85 - 1600 eV |
| Energy resolution | Energy and slit dependent, resolving power 4300 at 400 eV and slit 20 µm |
| Flux | see the flux curve below |
| Polarisation | horizontal |
| Focus size (hor. x vert.) | slit dependent, see the "focal size" figure below |
| Phone | +49 30 8062 14835 |
| More details | U49-2_PGM-1 |
| Station data | |
| Temperature range | room temperature |
| Pressure range | For details contact the station manager. |
| Detector | GaAs-photodiodes (4 mm x 4 mm) w/o pinholes and slits |
| Manipulators | for details see technical description in pdf-file |
| Sample holder compatibility | For details contact the station manager |
| Additional equipment | |
"A versatile UHV-polarimeter for the EUV XUV spectral range is described which incorporates two optical elements: a phase retarder and a reflection analyzer. Both optics are azimuthally rotatable around the incident synchrotron radiation beam and the incidence angle is freely selectable. This allows for a variety of reflectometry, polarimetry and ellipsometry applications on magnetic or non-magnetic samples and multilayer optical elements." http://dx.doi.org/10.17815/jlsrf-2-90
For more details, please contact the instrument scientist(s).