XMCD, XRF, NEXAFS, Reflectometry, Polarimetry, Ellipsometry, Reflectivity

Remote access

not possible

Station data
Temperature range room temperature
Pressure range For details contact the station manager.
Detector GaAs-photodiodes (4 mm x 4 mm) w/o pinholes and slits
Manipulators for details see technical description in pdf-file
Sample holder compatibility For details contact the station manager
Additional equipment
Applicable at beamline(s)
UE52_SGM 100 - 1500 eV
U49-2_PGM-1 85 - 1600 eV

"A versatile UHV-polarimeter for the EUV XUV spectral range is described which incorporates two optical elements: a phase retarder and a reflection analyzer. Both optics are azimuthally rotatable around the incident synchrotron radiation beam and the incidence angle is freely selectable. This allows for a variety of reflectometry, polarimetry and ellipsometry applications on magnetic or non-magnetic samples and multilayer optical elements." http://dx.doi.org/10.17815/jlsrf-2-90

  • Development of ML-optics for Polarisation Steering and Control
  • Full control of Stokes vector (S1, S2, S3) in XUV-range (<1000 eV)
  • Complete at-wavelength characterisiton of multilayer optics
  • Measurement of complex reflection or transmission coefficients (Amplitudes and Phases)
  • Polarisation Spectroscopy - Magneto-optics - XMCD, XMLD, T,L-MOKE, Faraday-, Kerr-effect

For more details contact the station scientist(s).