V6

Reflectometer

Publications

2019

Zuyev, S.Yu.; Pariev, D.E.; Pleshkov, R.S.; Polkovnikov, V.N.; Salashchenko, N.N.; Svechnikov, M.V.; Sertsu, M.G.; Sokolov, A.; Chkhalo, N.; Schäfers, F.: Mo/Si Multilayer Mirrors with B4C and Be Barrier Layers. , Journal of Surface Investigation 13 (2019), p. 169-172
doi:10.1134/S1027451019020216

Huang, Q.; Feng, J.; Li, T.; Wang, X.; Kozhenikov, I.V.; Yang, Y.; Qui, R.; Sokolov, A.; Giday Sertsu, M.; Schäfers, F.; Li, W.; Xie, C.; Zhang, Z.; Wang, Z.: Narrowband lamellar multilayer grating with low contrast MoSi2/Si materials for soft X-ray region. , Journal of Physics D: Applied Physics 52 (2019), p. 195303/1-6
doi:10.1088/1361-6463/ab0873

Mazuritskiy, M.I.; Lerer, A.M.; Kulov, S.K.; Samkanashvili, D.G.: On the Surface Structure of Microchannel Plates and the Excitation of X-Ray Fluorescence in Hollow Microcapillaries. , Journal of Surface Investigation 13 (2019), p. 499-507
doi:10.1134/S1027451019030297

Lin, D.; Liu, Z.; Dietrich, K.; Sokolov, A.; Sertsu, M.G.; Zhou, H.; Huo, T.; Kroker, S.; Chen, H.; Qiu, K.; Xu, X.; Schäfers, F.; Liu, Y.; Kley, E.-B.; Hong, Y.: Soft X-ray varied-line-spacing gratings fabricated by near-field holography using an electron beam lithography-written phase mask. , Journal of Synchrotron Radiation 26 (2019), p. 1782-1789
doi:10.1107/S1600577519008245

Polkovnikov, V.N.; Chkhalo, N.I.; Pleshkov, R.S.; Salashchenko, N.N.; Schäfers, F.; Sertsu, M.; Sokolov, A.; Svechnikov, M.V.; Zuev, S.Yu.: Stable high-reflection Be/Mg multilayer mirrors for solar astronomy at 30.4 nm. , Optics Letters 44 (2019), p. 263-266
doi:10.1364/OL.44.000263

Ronneburg, A.; Trapp, M.; Cubitt, R.; Silvi, L.; Cap, S.; Ballauff, M.; Risse, S.: Surface structure inhibited lithiation of crystalline silicon probed with operando neutron reflectivity. , Energy Storage Materials 18 (2019), p. 182-189
doi:10.1016/j.ensm.2018.11.032

Weiss, M.; Seidlhofer, B.-K.; Geiß, M.; Geis, C.; Busche, M.R.; Vargas-Barbosa, N.M.; Silvi, L.; Zeier, W.G.; Schröder, D.: Unraveling the Formation Mechanism of Solid–Liquid Electrolyte Interphases on LiPON Thin Films. , ACS Applied Materials & Interfaces 11(9) (2019), p. 9539-9547
doi:10.1021/acsami.8b19973

2018

Liedl, A.; Angelucci, M.; Francesca, Eliana La; Buchheim, J.; Gwalt, G.; Sokolov, A.; Sertsu, M. G.; Schäfers, F.; Siewert, F.; Cimino, R.: At-Wavelength Investigations on the Surface Quality of Accelerator Wall Materials for future Highest-Energy-Proton Circular Colliders. , 6th International Workshop on X-ray Optics and Metrology - IWXM 2018 Taiwan Photon Source, NSRRC in Hsinchu, Taiwan,, 06.06.2018 - 09.06.2018 (2018)

Sokolov, A.; Sertsu, M.G.; Eggenstein, F.; Schäfers, F.: At-Wavelength Metrology facility for XUV optics at BESSY-II. , The 13th International Conference on Synchrotron Radiation Instrumentation (SRI 2018) Taipei, Taiwan, 10.06.2018 - 15.06.2018 (2018)

Sertsu, M.G.; Sokolov, A.; Schäfers:, F.: Beryllium-containing multilayers for EUV applications. , The 13th International Conference on Synchrotron Radiation Instrumentation (SRI 2018) Taipei, Taiwan, 10.06.2018 - 15.06.2018 (2018)

Sertsu, M.G.; Sokolov, A.; Schäfers, F.; Svechnikov, M.V.; Gusev, S.A.; Nechay, A.N.; Pariev, D.E.; Polkovnikov, V.N.; Salashchenko, N.N.; Tatarsky, D.A.; Chkhalo, N.I.: Derivation of beryllium optical constants from Mo/Be multilayers. , Physics of X-Ray and Neutron- Multilayer Structures - PXRNMS2018 Palaiseau (France), 07.11.2018 - 09.11.2018 (2018)

Dziarzhytski, S.; Siewert, F.; Sokolov, A.; Gwalt, G.; Seliger, T.; Rübhausen, M.; Weigelt, H.; Brenner, G.: Diffraction gratings metrology and ray-tracing results for an XUV Raman spectrometer at FLASH. , Journal of Synchrotron Radiation 25 (2018), p. 138-144
doi:10.1107/S1600577517013066

Filatova, E.; Sokolov, A.: Effect of reflection and refraction on NEXAFS spectra measured in TEY mode. , Journal of Synchrotron Radiation 25 (2018), p. 232-240
doi:10.1107/S1600577517016253

Sokolov, A.; Sertsu, M.; Gaupp, A.; Lüttecke, M.; Schäfers, F.: Efficient high-order suppression system for a metrology beamline. , Journal of Synchrotron Radiation 25 (2018), p. 100-107
doi:10.1107/S1600577517016800

Frueh, J.; Rühm, A.; He, Q.; Möhwald, H.; Krastev, R.; Köhler, R.: Elastic to Plastic Deformation in Uniaxially Stressed Polylelectrolyte Multilayer Films. , Langmuir 34 (2018), p. 11933-11942
doi:10.1021/acs.langmuir.8b01296

Boyaciyan, D.; Braun, L.; Löhmann, O.; Silvi, L.; Schneck, E.; Von Klitzing, R.: Gold nanoparticle distribution in polyelectrolyte brushes loaded at different pH conditions. , The Journal of Chemical Physics 149 (2018), p. 163322
doi:10.1063/1.5035554

Huang, Qiushi; Yang, Xiaowei; Feng, Jiangtao; Kozhevnikov, Igor V.; Sokolov, Andrey; Senf, Friedmar; Schafers, Franz; Erko, Alexei; Wang, Hongchang; Bijkerk, Fred; Louis, Eric; Zhang, Zhong; Wang, Zhanshan: High efficiency multilayer blazed gratings for soft X-ray monochromator. , The 13th International Conference on Synchrotron Radiation Instrumentation (SRI 2018) Taipei, Taiwan, 10.06.2018 - 15.06.2018 (2018)

Sertsu, M.G.; Sokolov, A.; Eggenstein, F.; Schäfers, F.: High performance UV- and XUV At-Wavelength Metrology facility at BESSY-II. , XXII Symposium “Nanophysics and Nanoelectronics” Nizhny Novgorod, Russia, 12.03.2018 - 15.03.2018 (2018)

Sokolov, Andrey; Huang, Qiushi; Lemke, Stephanie; Alimov, Syvatoslav; Zeschke, Thomas; Kutz, Oliver; Seliger, Tino; Feng, Jiangtao; Gwalt, Grzegorz; Schäfers, Franz; Siewert, Frank; Wang, Zhanshan; Senf, Friedmar: Highly efficient multilayer-coated blazed grating for the tender X-ray energy range. , 6th International Workshop on X-ray Optics and Metrology - IWXM 2018 Taiwan Photon Source, NSRRC in Hsinchu, Taiwan,, 06.06.2018 - 09.06.2018 (2018)

Sokolov, Andrey; Huang, Qiushi; Lemke, Stephanie; Alimov, Syvatoslav; Zeschke, Thomas; Kutz, Oliver; Seliger, Tino; Feng, Jiangtao; Gwalt, Grzegorz; Schäfers, Franz; Siewert, Frank; Wang, Zhanshan; Senf, Friedmar: Highly efficient multilayer-coated blazed gratings for the tender X-ray energy range. , Physics of X-Ray and Neutron Multilayer Structures - PXRNMS2018 Palaiseau (France) , 07.11.2018 - 14.11.2018 (2018)

Svechnikov, M.V.; Chkhalo, N.I.; Gusev, S.A.; Nechay, A.N.; Pariev, D.E.; Pestov, A.E.; Polkovnikov, V.N.; Tatarskiy, D.A.; Salashchenko, N.N.; Schäfers, F.; Sertsu, M.G.; Sokolov, A.; Vainer, Y.A.; Zorina, M.V.: Influence of barrier interlayers on the performance of Mo/Be multilayer mirrors for next-generation EUV lithography. , Optics Express 26 (2018), p. 33718-33731
doi:10.1364/OE.26.033718

Mazuritskiy, M.I.; Lerer, A.M.; Dabagov, S.B.; Marcelli, A.; Kulov, S.K.; Sokolov, A.A.; Sertsu, M.G.: Interaction of Channeling X rays, Coherent Excitation of Fluorescence and Interference Phenomena of Transmitted Radiation at the Exit of Microchannel Plates. , The 8th International Conference Channeling 2018 - Charged & Neutral Particles Channeling Phenomena Ischia (NA)- Italy , 23.09.2018 - 28.09.2018 (2018)

Sokolov, Andrey; Hülsen, Christoph; Löchel, Bernd; Rudolph, Ivo; Erko, Alexei: Large area precise X-ray diffraction optical elements produced by nanoimprinting technology. , XXII Symposium “Nanophysics and Nanoelectronics” Nizhny Novgorod, Russia, 12.03.2018 - 15.03.2018 (2018)

Jerliu, B.; Hüger, E.; Dörrer, L.; Seidlhofer, B.-K.; Steitz, R.; Horisberger, M.; Schmidt, H.: Lithium insertion into silicon electrodes studied by cyclic voltammetry and operando neutron reflectometry. , Physical Chemistry Chemical Physics 20 (2018), p. 23480-23491
doi:10.1039/C8CP03540G

Clemens, Daniel: Neutron Instrumentation for Large Scale Structures. , Seminar Dep. of Nuclear Physics (China Institute of Atomic Energy) Peking, 10.09.2018 - 10.09.2018 (2018)

Majhi, A.; Nayak, M.; Pradhan, P.C.; Filatova, E.O.; Sokolov, A.; Schäfers, F.: Soft X-ray Reflection Spectroscopy for Nano-Scaled Layered Structure Materials. , Scientific Reports 8 (2018), p. 15724/1-9
doi:10.1038/s41598-018-34076-5

La Francesca, Eliana; Liedl, A.; Angelucci, M.; Sokolov, A.; Sertsu, M. G.; Schäfers, F.; Siewert, F.; Cimino, R.: Study of Reflectivity and Photo Yield on FCC-hh proposed beam screen surfaces. , FCC-Week 2018 Beurs van Berlage, Damrak 243, 1012 ZJ Amsterdam, Netherlands, 09.04.2018 - 13.04.2018 (2018)

2017

Cinar, S.; Moebitz, S.; Al-Ayoubi, S.; Seidlhofer, B.-K.; Czeslik, C.: Building Polyelectrolyte Multilayers with Calmodulin: A Neutron and X-ray Reflectivity Study. , Langmuir 33 (2017), p. 3982-3990
doi:10.1021/acs.langmuir.7b00651

Konashuk, A.; Filatova, E.; Sakhonenkov, S.; Afanas'ev, V.: Effect of deposition technique on chemical bonding and amount of porogen residues in organosilicate glass. , Microelectronic Engineering 178 (2017), p. 209-212
doi:10.1016/j.mee.2017.05.038

Jerliu, B.; Dörrer, L.; Hüger, E.; Seidlhofer, B.-K.; Steitz, R.; Borchardt, G.; Schmidt, H.: Electrochemical lithiation of silicon electrodes: neutron reflectometry and secondary ion mass spectrometry investigations. , International Journal of Materials Research 108 (2017), p. 999-1007
doi:10.3139/146.111536

Chkhalo, N.I.; Gusev, S.A.; Nechay, A.N.; Pariev, D.E.; Polkovnikov, V.N.; Salashchenko, N.N.; Schäfers, F.; Sertsu, M.G.; Sokolov, A.; Svechnikov, M.V.; Tatarsky, D.A.: High-reflection Mo/Be/Si multilayers for EUV lithography. , Optics Letters 42 (2017), p. 5070-5073
doi:10.1364/OL.42.005070

Ghafoor, N.; Birch, J.; Aquila, A.; Gullikson, E.; Schäfers, F.: Impact of B4C on structure and optical performance of Cr/Sc multilayer X-ray mirrors. , Optics Express 25 (2017), p. 18274-18287
doi:10.1364/OE.25.018274

Eggenstein, F.; Krivenkov, M.; Rudolph, I.; Sertsu, M.G.; Sokolov, A.; Varykhalov, A.; Wolf, J.; Zeschke, Th.; Schäfers, F.: Investigation of HF-plasma-treated soft x-ray optical elements. , In: Lahsen Assoufid ... [Ed.] : Advances in Metrology for X-Ray and EUV Optics VII. Bellingham, Washington: SPIE, 2017 (Proceedings of SPIE ; 10385). - ISBN 978-1-51061-227-3, p. 10385-1-7
doi:10.1117/12.2272967

Khaydukov, Yu.; Morari, R.; Lenk, D.; Zdravkov, V.; Merkel, D. G.; Seidlhofer, B. -K.; Mueller, C.; von Nidda, H. -A. Krug; Keller, T.; Steitz, R.; Sidorenko, A.; Horn, S.; Tidecks, R.; Keimer, B.: Magnetic state of Nb(1-7nm)/Cu30Ni70 (6nm) superlattices revealed by Polarized Neutron Reflectometry and SQUID magnetometry. , Journal of Physics : Conference Series 862 (2017), p. 012013/1-8
doi:10.1088/1742-6596/862/1/012013

Seidhofer, B.-K.; Trapp, M.; Jafta, C.; Risse, S.; Ballauff, M.: Neutrons are indispensable for research on energy materials. , International Conference on Neutron Scattering 2017 (ICNS 2017) Korea , 09.07.2017 - 13.07.2013 (2017)

Risse, Sebastian; Ballauff, Matthias; Seidlhofer, Beatrix; Trapp, Marcus; Jafta, Charl; Petzold, Albrecht; Goerigk, Günter; Mascotto, Simone: Neutrons are indispensable for research on energy materials! , ICNS Daejeon, Südkorea, 09.07.2017 - 13.07.2017 (2017)

Christau, S.; Moeller, T.; Genzer, J.; Koehler, R.; Von Klitzing, R.: Salt-Induced Aggregation of Negatively Charged Gold Nanoparticles Confined in a Polymer Brush Matrix. , Macromolecules 50 (2017), p. 7333-7343
doi:10.1021/acs.macromol.7b00866

Mazuritskiy, M. I.; Dabagov, S. B.; Lerer, A. M.; Dziedzic-Kocurek, K.; Sokolov, A.; Coreno, M.; Turchini, S.; D'Elia, A.; Sacchi, M.; Marcelli, A.: Transmission diffractive patterns of large microchannel plates at soft X-ray energies. , Nuclear Instruments & Methods in Physics Research B 402 (2017), p. 282-286
doi:10.1016/j.nimb.2017.02.075

Trapp, Marcus: V6: The Reflectometer at BER II. , Journal of Large Scale Research Facilities JLSRF 3 (2017), p. A114
doi:10.17815/jlsrf-3-154

2016

Sokolov, Andrey; Bischoff, Peter; Eggenstein, Frank; Erko, Alexei; Gaupp, Andreas; Künstner, S; Mast, Matthias; Schmidt, Jan-Simon; Senf, Friedmar; Siewert, Frank; Zeschke, Thomas; Schäfers, Franz: An EUV and XUV At-Wavelength Metrology facility at BESSY-II. , XX International Symposium Nanophysics and Nanoelectronics Nizhny Novgorod, Russia, 14.03.2016 - 18.03.2016 (2016)

Sokolov, A.; Bischoff, P.; Eggenstein, F.; Erko, A.; Gaupp, A.; Künstner, S.; Mast, M.; Schmidt, J.-S.; Senf, F.; Siewert, F.; Zeschke, T.; Schäfers, F.: At-wavelength metrology facility for soft X-ray reflection optics. , Review of Scientific Instruments 87 (2016), p. 052005/1-7
doi:10.1063/1.4950731

Wood, M.H.; Casford, M.T.; Steitz, R.; Zarbakhsh, A.; Welbourn, R.J.L.; Clarke, S.M.: Comparative Adsorption of Saturated and Unsaturated Fatty Acids at the Iron Oxide/Oil Interface. , Langmuir 32 (2016), p. 534-540
doi:10.1021/acs.langmuir.5b04435

Nayak, M.; Pradhan, P.C.; Lodha, G.S.; Sokolov, A.; Schäfers, F.: Corrigendum: Determining Chemically and Spatially Resolved Atomic Profile of Low Contrast Interface Structure with High Resolution. , Scientific Reports 6 (2016), p. 27322/1-7
doi:10.1038/srep27322

Gaikovich, P.K.; Polkovnikov, V.N.; Salashchenko, N.N.; Chkhalo, N.I.; Schäfers, F.; Sokolov, A.: Effect of roughness, deterministic and random errors in film thickness on the reflecting properties of aperiodic mirrors for the EUV range. , Quantum Electronics 46 (2016), p. 406-413
doi:10.1070/QEL16037

Nayak, M.; Pradhan, P.C.; Lodha, G.S.; Sokolov, A.; Schäfers, F.: Erratum: Determining Chemically and Spatially resolved Atomic Profile of Low Contrast Interface Structure with High Resolution. , Scientific Reports 6 (2016), p. 31016/1
doi:10.1038/srep31016

Senf, F.; Bijkerk, F.; Eggenstein, F.; Gwalt, G.; Huang, Q.; Kruijs, R.; Kutz, O.; Lemke, S.; Louis, E.; Mertin, M.; Packe, I.; Rudolph, I.; Schäfers, F.; Siewert, F.; Sokolov, A.; Sturm, J.M.; Waberski, C.; Wang, Z.; Wolf, J.; Zeschke, T.; Erko, A.: Highly efficient blazed grating with multilayer coating for tender X-ray energies. , Optics Express 24 (2016), p. 13220-13230
doi:10.1364/OE.24.013220

Passvogel, M.; Nestler, P.; Köhler, R.; Soltwedel, O.; Helm, C.A.: Influence of Binary Polymer Mixtures on the Nonlinear Growth Regimes of Polyelectrolyte Multilayer Films. , Macromolecules 49 (2016), p. 935-949
doi:10.1021/acs.macromol.5b01674

Filatova, E.O.; Konashuk, A.S.; Schäfers, F.; Afanasev, V.V.: Metallization-Induced Oxygen Deficiency of γ-Al2O3 Layers. , The Journal of Physical Chemistry C 120 (2016), p. 8979-8985
doi:10.1021/acs.jpcc.6b01352

Steitz, Roland: Neutron & X-Ray Reflectivity, GISAS. , 13th EUROPEAN SUMMER SCHOOL ON "SCATTERING METHODS APPLIED TO SOFT CONDENSED MATTER" Bombannes, Gironde, France, 20.07.2016 - 27.07.2016 (2016)

Filatova, E.O.; Konashuk, A.S.; Petrov, Yu.; Ubyivovk, E.; Sokolov, A.A.; Selivanov, A.; Drozd, V.: NEXAFS study of electronic and atomic structure of active layer in Al/indium tin oxide/TiO2 stack during resistive switching. , Science and Technology of Advanced Materials 17 (2016), p. 274-284
doi:10.1080/14686996.2016.1182851

Nagy, B.; Khaydukov, Yu.; Efremov, D.; Vasenko, A.S.; Mustafa, L.; Kim, J.-H.; Keller, T.; Zhernenkov, K.; Devishvili, A.; Steitz, R.; Keimer, B.; Bottyan, L.: On the explanation of the paramagnetic Meissner effect in superconductor/ferromagnet heterostructures. , EPL 116 (2016), p. 17005/1-6
doi:10.1209/0295-5075/116/17005

Kreuzer, M.; Trapp, M.; Dahint, R.; Steitz, R.: Polymer-Induced Swelling of Solid-Supported Lipid Membranes. , Membranes 6 (2016), p. 2/1-15
doi:10.3390/membranes6010002

Steitz, Roland: Reflectivity and GISAS. , 36th Berlin School on Neutron Scattering Berlin, 25.02.2016 - 04.03.2016 (2016)

Mantouvalou, I.; Witte, K.; Martyanov, W.; Jonas, A.; Groetzsch, D.; Streeck, C.; Löchel, H.; Rudolph, I.; Erko, A.; Stiel, H.; Kanngiesser, B.: Single shot near edge x-ray absorption fine structure spectroscopy in the laboratory. , Applied Physics Letters 108 (2016), p. 201106/1-4
doi:10.1063/1.4951000

Eggenstein, F.; Bischoff, P.; Schäfers, F.; Schroeter, T.; Senf, F.; Sokolov, A.; Zeschke, T.; Erko, A.: Survey and adjustment methods applied on an 11 axes high performance reflectometer for synchrotron radiation. , AIP Conference Proceedings 1741 (2016), p. 030025/1-4
doi:10.1063/1.4952848

Schäfers, F.; Bischoff, P.; Eggenstein, F.; Erko, A.; Gaupp, A.; Künstner, S.; Mast, M.; Schmidt, J.-S.; Senf, F.; Siewert, F.; Sokolov, A.; Zeschke, T.: The at-wavelength metrology facility for UV- and XUV-reflection and diffraction optics at BESSY-II. , Journal of Synchrotron Radiation 23 (2016), p. 66-77
doi:10.1107/S1600577515020615

Levin, A.; Erlkamp, M.; Steitz, R.; Czeslik, C.: Volume profile of alpha-chymotrypsin during adsorption and enzymatic reaction on a poly(acrylic acid) brush. , Physical Chemistry Chemical Physics 18 (2016), p. 9070-9078
doi:10.1039/c6cp00843g

Jansing, C.; Mertins, H.-Ch.; Gilbert, M.; Wahab, H.; Timmers, H.; Choi, S.-H.; Gaupp, A.; Krivenkov, M.; Varykhalov, A.; Rader, O.; Legut, D.: X-ray natural birefringence in reflection from graphene. , Physical Review B 94 (2016), p. 045422/1-12
doi:10.1103/PhysRevB.94.045422

2015

Firsov, A.; Firsov, A.; Löchel, H.; Probst, J.; Loukas, P.; Erko, A.: 3-Dimensional profiling for diffraction optical elements. , SPIE Optics + Optoelectronics Prague, 13.04.2015 - 16.04.2016 (2015)

Sokolov, Andrey; Bischoff, Peter; Eggenstein, Frank; Erko, Aleksei; Gaupp, Andreas; Künstner, Silvio; Mast, Matthias; Schmidt, Jan-Simon; Senf, Friedmar; Siewert, Frank; Zeschke, Thomas; Schäfers, Franz: An XUV At-Wavelength Metrology facility at BESSY-II. , 12th International Conference on Synchrotron Radiation Instrumentation (SRI 2015) New York City, 06.07.2015 - 10.07.2015 (2015)

Sokolov, Andrey; Bischoff, Peter; Eggenstein, Frank; Erko, Alexei; Gaupp, Andreas; Künstner, Silvio; Mast, Matthias; Schmidt, Jan-Simon; Senf, Fred; Siewert, Frank; Zeschke, Thomas; Schäfers, Franz: An XUV At-Wavelength Metrology facility at BESSY-II. , PTB Seminar VUV und EUV Berlin, 05.11.2015 - 06.11.2015 (2015)

Sokolov, Andrey; Bischoff, Peter; Eggenstein, Frank; Erko, Alexei; Gaupp, Andreas; Künstner, Silvio; Mast, Matthias; Schmidt, Jan-Simon; Siewert, Frank; Zeschke, Thomas; Schäfers, Franz: At-Wavelength Metrology facility for XUV reflection gratings. , Internat. Workshop X-ray Metrology IWXM Berkeley, CA USA, 13.07.2015 - 16.07.2015 (2015)

Nestler, P.; Passvogel, M.; Ahrens, H.; Soltwedel, O.; Köhler, R.; Helm, C.A.: Branched Poly(ethylenimine) as Barrier Layer for Polyelectrolyte Diffusion in Multilayer Films. , Macromolecules 48 (2015), p. 8546-8556
doi:10.1021/acs.macromol.5b01065

Kozhevnikov, I.V.; Filatova, E.O.; Sokolov, A.A.; Konashuk, A.S.; Siewert, F.; Störmer, M.; Gaudin, J.; Keitel, B.; Samoylova, L.; Sinn, H.: Comparative study of the X-ray reflectivity and in-depth profile of a-C, B4C and Ni coatings at 0.1–2 keV. , Journal of Synchrotron Radiation 22 (2015), p. 1-6
doi:10.1107/S1600577515000430

Steitz, Roland; Seidlhofer, Beatrix-Kamelia; Cubitt, Robert; Ballauff, Matthias; Jerliu, Bujar; Hüger, Erwin; Schmidt, Harald: Electrochemical energy storage und the usefulness of neutrons - In-situ and operando studies on silicon anodes for Li-ion batteries. , Current Trends and Future Perspectives in Neutron Reflectometry Lillestrøm, Norway, 08.06.2015 - 09.06.2015 (2015)

Steitz, R.: Functional Interfaces on Nanoscale. , Neutronen in Forschung und Industrie, Maier-Leibnitz-Zentrum München, 19.10.2015 - 19.10.2015 (2015)

Siewert, Frank; Buchheim, Jana; Eggenstein, Frank; Gwalt, Grzegorz; Kutz, Oliver; Loechel, Bernd; Lemke, Steffanie; Rudolph, Ivo; Schäfers, Franz; Schmidt, Martin; Senf, Friedmar; Seeliger, Tino; Sokolov, Andrey; Waberski, Christoph; Wolf, Johannes; Zeschke, Thomas; Zizak, Ivo; Nelles, Bruno; Erko, Alexei: Gratings for Synchroton- and FEL-beamlines – on a project for manufacturing ultra-precise gratings at Helmholtz Zentrum Berlin . , PhotonDiag 2015 - 2nd Workshop on FEL Photon Diagnostics, Instrumentation, and Beamlines International Centre for Theoretical Physics (ICTP), Trieste (I), 08.06.2015 - 10.06.2015 (2015)

Erko, A.; Hafner, A.; Anklamm, L.; Firsov, A.; Löchel, H.; Sokolov, A.; Gubzokov, R.: iZPS-SEM: the new spectrometer for ultra-light elements. , 8. Fachtagung Prozessnahe Röntgenanalytik, PRORA Berlin, 11.11.2015 - 13.11.2015 (2015)

Fernandez‐Herrero, Analia; Braig, Christoph; Löchel, Heike; Firsov, Alexander; Brzhezinskaya, Maria; Erko, Alexei: Multi‐wavelength reflection zone plate arrays for wide‐range soft X‐ray spectroscopy. , 2nd German-Swedish Workshop on X-ray Optics Berlin, 28.04.2015 - 30.04.2015 (2015)

Steitz, Roland: Neutron and X-ray Reflectivity. , 35th Berlin School on Neutron Scattering Berlin, 26.02.2015 - 06.03.2015 (2015)

Brzhezinskaya, Maria; Firsov, Alexander; Erko, Alexei: New Reflection Zone Plate Array Optics with Individual Depth Profiles for Ultra-fast X-Ray Applications. , 12th International Conference SRI-2015, , New York Ciry, 06.07.2015 - 10.07.2015 (2015)

Senf, Fred: Performance of a blazed multilayer grating for energies between 800 eV and 5000 eV, calculations and measurements. , 2nd German-Swedish Workshop on X-ray Optics Berlin, 28.04.2015 - 30.04.2015 (2015)

Cimino, R.; Baglin, V.; Schäfers, F.: Potential remedies against the high Synchrotron Radiation induced heat load for future highest energy proton circular colliders. , Physical Review Letters 115 (2015), p. 264804/1-5
doi:10.1103/PhysRevLett.115.264804

Siewert, Frank; Buchheim, Jana; Eggenstein, Frank; Gwalt, Grzegorz; Kutz, Oliver; Loechel, Bernd; Lemke, Steffanie; Rudolph, Ivo; Schäfers, Franz; Senf, Friedmar; Seeliger, Tino; Sokolov, Andrey; Waberski, Christoph; Wolf, Johannes; Zeschke, Thomas; Zizak, Ivo; Nelles, Bruno; Erko, Alexei: Recent achievements on optical metrology and manufacturing of gratings at HZB . , Seminar at SLAC Stanford (USA), 17.02.2015 - 17.02.2015 (2015)

Hafner, A.; Anklamm, L.; Firsov, A.; Firsov, A.; Löchel, H.; Sokolov, A.; Gubzokov, R.; Erko, A.: Reflection zone plate wavelength-dispersive spectrometer for ultra-light elements measurements. , Optics Express 23 (2015), p. 29476-29483
doi:10.1364/OE.23.029476

Steitz, Roland: Reflectivity and GISAS. , COST2015 London, Action CM 1101, School on Interfacial Science and Fluid Mechanics: Fundamentals, Applications, and Analytical Methods London, 13.04.2015 - 16.04.2015 (2015)

Steitz, Roland: Reflectivity and GISAS - scattering from interfaces. , Summer School: Biointerfaces and Surface Characterization Freie Universität Berlin, 17.09.2015 - 18.09.2015 (2015)

Steitz, Roland: Reflectivity and GISAS - scattering from interfaces. , Summer School: Biointerfaces and Surface Characterization Freie Universität Berlin, 17.09.2015 - 18.09.2015 (2015)

Früh, J.; Rühm, A.; Möhwald, H.; Krastev, R.; Köhler, R.: Reflectometry on curved interfaces. , Physica B 457 (2015), p. 202-211
doi:10.1016/j.physb.2014.08.030

Paul, A.; Teichert, A.; Krist, T.; Steitz, R.: Substrate-stress-induced magnetic and nonmagnetic structural correlations in Fe/Si multilayers. , Journal of Applied Crystallography 48 (2015), p. 1023-1033
doi:10.1107/S1600576715009942

Eggenstein, Frank; Bischoff, Peter; Erko, Aleksei; Schroeter, Thomas; Senf, Friedmar; Sokolov, Andrey; Zeschke, Thomas; Schäfers, Franz: Survey and adjustment methods applied on an 11 axes high performance reflectometer for synchrotron radiation. , 12th International Conference on Synchrotron Radiation Instrumentation (SRI 2015) New York City, 06.07.2015 - 10.07.2015 (2015)

Sokolov, Andrey; Bischoff, Peter; Eggenstein, Frank; Erko, Aleksei; Gaupp, Andreas; Künstner, Silvio; Mast, Matthias; Schmidt, Jan-Simon; Senf, Friedmar; Siewert, Frank; Zeschke, Thomas; Schäfers, Franz: The At-Wavelength Metrology facility for UV- and XUV- optics at BESSY-II. , Second Swedish-German Workshop on X-Ray Optics Berlin, 28.04.2015 - 30.04.2015 (2015)

Schäfers, Franz; Bischoff, Peter; Eggenstein, Frank; Erko, Alexei; Gaupp, Andreas; Künstner, Silvio; Mast, Matthias; Schmidt, Jan-Simon; Senf, Fred; Siewert, Frank; Sokolov, Andrey; Zeschke, Thomas: The At-Wavelength Metrology facility for UV- and XUV-reflection optics at BESSY-II. , Workshop on Photon Diagnostics PhotonDiag2015 Trieste, 08.06.2015 - 10.06.2015 (2015)

Filatova, Elena; Konashuk, Alexei; Konyushenko, Marina; Sokolov, Andrey; Kozhevnikov, Igor: X-ray spectroscopic studies of metal/insulator (transition-metal-oxide) interface. , 12th International Conference on Nanosciences & Nanotechnologies – NN15 Thessaloniki, Greece, 07.07.2015 - 10.07.2015 (2015)

2014

Eggenstein, F.; Bischoff, P.; Gaupp, A.; Senf, F.; Sokolov, A.; Zeschke, Th.; Schäfers, F.: A reflectometer for at-wavelength characterization of XUV-reflection gratings. , In: Lahsen Assoufid [Ed.] : Advances in Metrology for X-Ray and EUV Optics V. SPIE, 2014 (Proceedings of SPIE ; 9206). - ISBN 978-1-62841-233-8, p. 920607/1-12
doi:10.1117/12.2061828

Köhler, R.; Steitz, R.; von Klitzing, R.: About different types of water in swollen polyelectrolyte multilayers. , Advances in Colloid and Interface science 207 (2014), p. 325-331
doi:10.1016/j.cis.2013.12.015

Sokolov, A.A.; Eggenstein, F.; Erko, A.; Follath, R.; Künstner, S.; Mast, M.; Schmidt, J.S.; Senf, F.; Siewert, F.; Zeschke, Th.; Schäfers, F.: An XUV Optics Beamline at BESSY II. , In: Lahsen Assoufid [Ed.] : ADVANCES IN METROLOGY FOR X-RAY AND EUV OPTICS V : Conference on Advances in Metrology for X-Ray and EUV Optics V . SPIE, 2014 (Proceedings of SPIE , 9206), p. 92060J/1-13
doi:10.1117/12.2061778

Filatova, E.O.; Kozhevnikov, I.V.; Sokolov, A.A.; Konashuk, A.S.; Schaefers, F.; Popovici, M.; Afanas’ev, VV.: Application of soft X-ray reflectometry for analysis of underlayer influence on structure of atomic-layer deposited SrTixOy films. , Journal of Electron Spectroscopy and Related Phenomena 196 (2014), p. 110-116
doi:10.1016/j.elspec.2014.01.021

Konyushenko, M.A.; Konashuk, A.S.; Sokolov, A.A.; Schäfers, F.; Filatova, E.O.: Effect of thermal annealing and Al2O3-interlayer on intermixing in the TiN/SiO2/Si structure. , Journal of Electron Spectroscopy and Related Phenomena 196 (2014), p. 117-120
doi:10.1016/j.elspec.2013.12.001

Seidlhofer, B.-K.; Jerliu, B.; Hüger, E.; Schmidt, H.; Ballauff, M.; Steitz, R.: In-situ studies of the lithium incorporation into lithium-ion battery model systems. , Electrochemistry 2014 Johannes Gutenberg-Universität Mainz, 22.09.2014 - 24.09.2014 (2014)

Menendez, E.; Dias, T.; Geshev, J.; Lopez-Barbera, J.F.; Nogues, J.; Steitz, R.; Kirby, B.J.; Borchers, J.A.; Pereira, L.M.C.; Vantomme, A.; Temst, K.: Interdependence between training and magnetization reversal in granular Co-CoO exchange bias systems. , Physical Review B 89 (2014), p. 144407/1-9
doi:10.1103/PhysRevB.89.144407

Seidlhofer, B.-K.; Jerliu, B.; Hüger, E.; Cubitt, R.; Schmidt, H.; Ballauff, M.; Steitz, R.: Lithiation of a crystalline silicon model anode for lithium-ion batteries. , Sixth Joint BER II and BESSY II User Meeting Lise-Meitner Campus, Berlin-Wannsee and Wilhelm-Conrad-Roentgen Campus, Berlin-Adlershof, 03.12.2014 - 05.12.2014 (2014)

Steitz, Roland: Reflectivity and GISAS. , Introduction to Neutron Scattering for Crystallographers HZB, Berlin, 21.03.2014 - 22.03.2014 (2014)

Cimino, R.; Schäfers, F.: Soft X-Ray Reflectivity and Photoelectron Yield of Technical Materials: Experimental Input for Instability Simulations in High Intensity Accelerators. , In: Proceedings of IPAC 2014, Dresden, Germany. Dresden, 2014. - ISBN 978-3-95450-132-8, p. 2335-2337

Cimino, R.; Schäfers, F.: Soft X-Ray Reflectivity and Photoelectron Yield of Technical Materials: Experimental Input for Instability Simulations in High Intensity Accelerators. , IPAC 2014 Dresden, 15.06.2014 - 20.06.2014 (2014)

Filatova, E.O.; Baraban, A.P.; Konashuk, A.S.; Konyushenko, M.A.; Selivanov, A.A.; Sokolov, A.A.; Schäfers, F.; Drozd, V.E.: Transparent-conductive-oxide (TCO) buffer layer effect on the resistive switching process in metal/TCO/TiO2/metal assemblies. , New Journal of Physics 16 (2014), p. 113014/1-15
doi:10.1088/1367-2630/16/11/113014

Jerliu, B.; Hüger, E.; Dörrer, L.; Seidlhofer, B.-K.; Steitz, R.; Oberst, V.; Geckle, U.; Bruns, M.; Schmidt, H.: Volume Expansion during Lithiation of Amorphous Silicon Thin Film Electrodes Studied by In-Operando Neutron Reflectometry. , The Journal of Physical Chemistry C 118 (2014), p. 9395-9399
doi:10.1021/jp502261t

2013

Eggenstein, F.; Schäfers, F.; Erko, A.; Follath, R.; Gaupp, A.; Löchel, B.; Senf, F.; Zeschke, T.: A reflectometer for at-wavelength characterization of gratings. , Nuclear Instruments & Methods in Physics Research A 710 (2013), p. 166–171
doi:10.1016/j.nima.2012.10.132

Konashuk, A.S.; Sokolov, A. A.; Schaefers, F.; Filatova, E.O.: Ar^+-ion sputtering influence on chemical bonding of low-k Organosilicate Glass: X-ray reflection spectroscopy study. , 15th European Conference on Applications of Surface and Interface Analysis 2013, ECASIA’13 Forte Village Resort, Sardinia, Italy, 13.10.2013 - 18.10.2013 (2013)

Konashuk, A. S.; Sokolov, A. A.; Schaefers, F.; Filatova, E. O.: Compositional and chemical bonding analysis of low-k Organosilicate Glasses: X-ray reflection spectroscopy study. , 38th VUVX conference Hefei, China, 12.07.2013 - 18.07.2013 (2013)

Reinhardt, M.; Dzubiella, J.; Trapp, M.; Gutfreund, P.; Kreuzer, M.; Gröschel, A.H.; Müller, A.H.E.; Ballauff, M.; Steitz, R.: Fine-Tuning the Structure of Stimuli-Responsive Polymer Films by Hydrostatic Pressure and Temperature. , Macromolecules 46 (2013), p. 6541-6547
doi:10.1021/ma400962p

Reinhardt, Matthias; Dzubiella, Joachim; Trapp, Marcus; Gutfreund, Philipp; Kreuzer, Martin; Gröschel, Andre, H.; Müller, Axel, H. E.; Ballauff, Matthias; Steitz, Roland: Fine-tuning the structure of stimuli-responsive polymer films by hydrostatic pressure and temperature. , PAT 2013 FU Berlin, 29.09.2013 - 02.10.2013 (2013)

Steitz, Roland: Functional Interfaces on nanoscale - how neutrons can help -. , Institutsseminar, Fakultät für Natur- und Materialwissenschaften, TU Clausthal Clausthal-Zellerfeld, 21.11.2013 - 21.11.2013 (2013)

Chkhalo, N.I.; Künstner, S.; Polkovnikov, V.N.; Salashchenko, N.N.; Schäfers, F.; Starikov, S.D.: High performance La/B4C multilayer mirrors with C-barrier layers for the next generation lithography. , Applied Physics Letters 102 (2013), p. 011602/1-3
doi:10.1063/1.4774298

Zerball, M.; Soltwedel, O.; von Klitzing, R.; Köhler, R.: Inflence of diffusion and dipping time on the inner structure of polyelectrolyte multilayers. , In: Annual Report 2012 / Heinz Maier-Leibnitz Zentrum (MLZ). Garching, 2013, p. 81-82

Konyushenko, M.; Konashuk, A.S.; Sokolov, A. A.; Schaefers, F.; Filatova, E.O.: Influence of annealing conditions on γ-Al_2O_3 crystallization. , 15th European Conference on Applications of Surface and Interface Analysis 2013, ECASIA’13 Forte Village Resort, Sardinia, Italy, 13.10.2013 - 18.10.2013 (2013)

Jerliu, B.; Dörrer, L.; Hüger, E.; Borchardt, G.; Steitz, R.; Geckle, U.; Oberst, V.; Bruns, M.; Schneider, O.; Schmidt, H.: Neutron reflectometry studies on the lithiation of amorphous silicon electrodes in lithium-ion batteries. , Physical Chemistry Chemical Physics 15 (2013), p. 7777-7784
doi:10.1039/c3cp44438d

Koo, J.; Erlkamp, M.; Grobelny, S.; Steitz, R.; Czeslik, C.: Pressure-Induced Protein Adsorption at Aqueous-Solid Interfaces. , Langmuir 29 (2013), p. 8025-8030
doi:10.1021/la401296f

Steitz, Roland: Soft solid-liquid interfaces – From simple to complex. , The Impact and Future Directions of Scattering Techniques in Soft Matter, Rideal symposium in honour and celebration of the contribution of Professor Jeffrey Penfold Keble College Oxford, UK, 18.03.2013 - 19.03.2013 (2013)

Schäfers, F.; Cimino, R.: Soft X-ray Reflectivity : from Quasi-Perfect Mirrors to Accelerator Walls. , In: CERN [Ed.] : Joint INFN-CERN-EuCARD-AccNet Workshop on Electron-Cloud Effects ; ECLOUD'12 ; 5 - 9 Jun 2012, La Biodola, Isola d’Elba, Italy . Geneva, 2013 CERN-2013-002 ; INFN-12-26-LNF ; EuCARD-CON-2013-001, p. 105-115
doi:10.5170/CERN-2013-002.105

Konashuk, A.S.; Sokolov, A.A.; Drozd, V.E.; Schaefers, F.; Filatova, E.O.: Study of Al2O3 nanolayers synthesized onto porous SiO2 using X-ray reflection spectroscopy. , Thin Solid Films 534 (2013), p. 363–366
doi:10.1016/j.tsf.2013.03.020

Schäfers, F.; Sokolov, A. A.; Senf, F.; Mast, M.; Schmidt, J. S.; Eggenstein, F.; Siewert, F.; Erko, A.: The New XUV Optics Beamline at BESSY II-HZB. , MEADOW - Metrology, Astronomy, Diagnostics and Optics Workshop Trieste, Italien, 28.10.2013 - 30.10.2013 (2013)

Schäfers, F.; Sokolov, A. A.; Senf, F.; Mast, M.; Schmidt, J. S.; Eggenstein, F.; Siewert, F.; Erko, A.: The New XUV Optics Beamline at BESSY II-HZB. , 5th HZB user meeting Berlin, Germany, 04.12.2013 - 06.12.2013 (2013)

Sokolov, A. A.; Schäfers, F.; Senf, F.; Schmidt, J. S.; Eggenstein, F.; Siewert, F.; Erko, A.: The XUV Optics Beamline at BESSY II-HZB. , 273. PTB-Seminar VUV and EUV Metrology Berlin, 24.10.2013 - 25.10.2013 (2013)

Sokolov, A. A.; Schäfers, F.; Follath, R.; Senf, F.; Mast, M.; Schmidt, J. S.; Eggenstein, F.; Siewert, F.; Erko, A.: The XUV Optics Beamline at BESSY II-HZB. , 38th VUVX conference Hefei, China, 12.07.2013 - 18.07.2013 (2013)

Filatova, E.O.; Kozhevnikov, I.V.; Sokolov, A.A.; Yegorova, Yu.V.; Konashuk, A.S.; Vilkov, O.Yu; Schaefers, F.; Gorgoi, M.; Shulakov, A.S.: X-ray and photoelectron spectroscopic nondestructive methods for thin films and interfaces study. Application to SrTiO3 based heterostuctures. , Microelectronic Engineering 109 (2013), p. 13-16
doi:10.1016/j.mee.2013.03.095

Filatova, E. O.; Kozhevnikov, I. V.; Sokolov, A. A.; Egorova, Yu. V.; Konashuk, A. S.; Vilkov, O. Yu.; Schaefers, F.; Gorgoi, M.: X-ray spectroscopic nondestructive methods for thin films and interfaces study. Application to SrTiO_3 based heterostuctures. , 5th HZB user meeting Berlin, Germany, 04.12.2013 - 06.12.2013 (2013)

2012

Eggenstein, F; Bischoff, P; Gaupp, A; Schäfers, F; Senf, F; Zeschke, T: A new reflectometer for at-wavelength characterization of gratings. , 4th International Workshop on Metrology for X-ray Optics, Mirror design and Fabrication Barcelona, Spain, 04.07.2012 - 06.07.2012 (2012)

Uschakow, S; Gaupp, A; MacDonald1, M; Schäfers, F.: EUV Ellipsometry on Mo/Si Multilayers. , 4th International Workshop on Metrology for X-ray Optics, Mirror design and Fabrication Barcelona, Spain, 04.07.2012 - 06.07.2012 (2012)

Demeter, J.; Menendez, E.; Schrauwen, A.; Teichert, A.; Steitz, R.; Vandezande, S.; Wildes, A.R.; Vandervorst, W.; Temst, K.; Vantomme, A.: Exchange bias induced by O ion implantation in ferromagnetic thin films. , Journal of Physics D: Applied Physics 45 (2012), p. 405004/1-8
doi:10.1088/0022-3727/45/40/405004

Clemens, Daniel; Bleif, Hans-Jürgen; Krist, Thomas; Welzel, Stefan; Niemann, Holger: Experiences from the exchange of the bi-spectral extraction guide NG4 at BER-II. , Neutron Delivery Systems Grenoble, 09.07.2012 - 11.07.2012 (2012)

Paul, A.: Grazing incidemce polarized neutron scattering in reflection geometry from nanolayered spintronic systems. , Pramana 78 (2012), p. 1 - 58
doi:10.1007/s12043-011-0207-z

Paul, A.: Grazing incidence polarized neutron scattering in reflection geometry from nanolayered spintronic systems. , Pramana 78 (2012), p. 1-58

Kreuzer, M.: IMPACT OF A MODEL SYNOVIAL FLUID ON SUPPORTED LIPID MEMBRANES . , Australian Nuclear Science and Technology Organisation Australian Nuclear Science and Technology Organisation (ANSTO) Australien, 09.04.2012 - 13.04.2012 (2012)

Kreuzer, Martin: Impact of a model synovial fluid on supported lipid membranes. , 2nd Soft Matter & Life Science Workshop Potsdam, 20.03.2012 - 21.03.2012 (2012)

Kreuzer, M.; Strobl, M.; Reinhardt, M.; Hemmer, M.C.; Hauß, T.; Dahint, R.; Steitz, R.: Impact of a model synovial fluid on supported lipid membranes. , Biochimica et Biophysica Acta - Biomembranes 1818 (2012), p. 2648-2659
doi:10.1016/j.bbamem.2012.05.022

Kreuzer, Martin: Impact of a model synovial fluid on supported lipid membranes. , Australian Nuclear Science and Technology Organisation Australian Nuclear Science and Technology Organisation (ANSTO) Australien, 09.04.2012 - 13.04.2012 (2012)

Demeter, J.; Menéndez, E.; Teichert, A.; Steitz, R.; Paramanik, D.; Van Haesendonck, C.; Vantomme, A.; Temst, K.: Influence of magnetocrystalline anisotropy on the magnetization reversal mechanism in exchange bias Co/CoO bilayers. , Solid State Communications 152 (2012), p. 292-295
doi:10.1016/j.ssc.2011.11.026

Soltwedel, O.; Nestler, P.; Neumann, H.-G.; Paßvogel, M.; Köhler, R.; Helm, C.A.: Influence of Polycation (PDADMAC) Weight on Vertical Diffusion within Polyelectrolyte Multilayers during Film Formation and Postpreparation Treatment. , Macromolecules 45 (2012), p. 7995-8004
doi:10.1021/ma301605x

Kreuzer, Martin; Steitz, Roland; Reinhardt, Matthias: Lipid-Coated Implant Materials under Load. , DPG-Frühjahrstagung 2012 Berlin, 25.03.2012 - 30.03.2012 (2012)

Satapathy, D.K.; Uribe-Laverde, M.A.; Marozau, I.; Malik, V.K.; Das, S.; Wagner, Th.; Marcelot, C.; Stahn, J.; Brück, S.; Rühm, A.; Macke, S.; Tietze, T.; Goering, E.; Frano, A.; Kim, J.-H.; Wu, M.; Benckiser, E.; Keimer, B.; Devishvili, A.; Toperverg, B.P.; Merz, M.; Nagel, P.; Schuppler, S.; Bernhard, C.: Magnetic Proximity Effect in YBa2Cu3O7/La2/3Ca1/3MnO3 and YBa2Cu3O7/LaMnO3+delta Superlattices. , Physical Review Letters 108 (2012), p. /1-5
doi:10.1103/PhysRevLett.108.197201

Philippe, B.; Dedryvere, R.; Allouche, J.; Lindgren, F.; Gorgoi, M.; Rensmo, H.; Gonbeau, D.; Edström, K.: Nanosilicon Electrodes for Lithium-Ion Batteries: Interfacial Mechanisms Studied by Hard and Soft X-ray Photoelectron Spectroscopy. , Chemistry of Materials 24 (2012), p. 1107-1115
doi:10.1021/cm2034195

Modi, M.H; Rai, S.K.; Idir, M.; Schaefers, F.; Lodha, G.S.: NbC/Si multilayer mirror for next generation EUV light sources. , Optics Express 20 (2012), p. 15114-15120
doi:10.1364/OE.20.015114

Früh, Johannes; Rühm, Adrian; Möhwald, Helmuth; Krastev, Rumen; Köhler, Ralf: Neutron and X-Ray Reflectometry at Mechanically Loaded Thin Soft Matter Films:Investigating Structure, Elasticity, and Swelling Behavior. , American Conference on Neutron Scattering Washington, USA, 24.06.2012 - 28.06.2012 (2012)

Früh, Johannes; Rühm, Adrian; Möhwald, Helmuth; Krastev, Rumen; Köhler, Ralf: Polyelectrolyte Multilayers under Mechanical Stress: Studying Changes in Structure, Elasticity, and Swelling Behavior with Neutron and X-Ray Reflectometry. , JCNS Workshop Tutzing, 08.10.2012 - 11.10.2012 (2012)

Kreuzer, Martin; Trapp, Marcus; Reinhardt, Matthias; Dahint, Reiner; Steitz, Roland: Polymer induced swelling of solid supported lipid membranes. , 19th Ostwald-Kolloquium Berlin, 20.09.2012 - 21.09.2012 (2012)

Kalisvaart, W.P.; Luber, E.J.; Poirier, E.; Harrower, C.T.; Teichert, A.; Wallacher, D.; Grimm, N.; Steitz, R.; Fritzsche, H.; Mitlin, D.: Probing the Room Temperature Deuterium Absorption Kinetics in Nanoscale Magnesium Based Hydrogen Storage Multilayers Using Neutron Reflectometry, X-ray Diffraction, and Atomic Force Microscopy. , The Journal of Physical Chemistry C 116 (2012), p. 5868-5880
doi:10.1021/jp209296b

Reinhardt, Matthias; Kreuzer, Martin; Geue, Thomas; Dahint, Reiner; Ballauff, Matthias; Steitz, Roland: Protein adsorption to planar polymer brushes – the effects of charge and grafting density. , 243rd ACS National Meeting San Diego, CA, 25.03.2012 - 29.03.2012 (2012)

Reinhardt, M.; Kreuzer, M.; Geue, T.; Dahint, R.; Ballauff, M.; Steitz, R.: Protein adsorption to polymer brushes of varied grafting density at elevated hydrostatic pressure. , Science and Scientists @ ESS Berlin, 19.04.2012 - 20.04.2012 (2012)

Paul, N.; Paul, A.; Steitz, R.; Kreuzer, M.; Lux-Steiner, M.Ch.: Selective Self Assembly of Glutamate Molecules on Polyelectrolyte Multilayers. , The Journal of Physical Chemistry B 116 (2012), p. 4492-4499
doi:10.1021/jp2104648

Steitz, Roland: Soft solid-liquid interfaces. , Workshop on off-specular neutron scattering Universite Libre de Bruxelles, 09.01.2012 - 10.01.2012 (2012)

Schäfers, F.: The new HZB-reflectometer for at-wavelength metrology on gratings. , SAC meeting Grating project - HZB Berlin, Deutschland, 17.06.2012 - 18.06.2012 (2012)

2011

Poirier, E.; Harrower, C.T.; Kalisvaart, P.; Bird, A.; Teichert, A.; Wallacher, D.; Grimm, N.; Steitz, R.; Mitlin, D.; Fritzsche, H.: Deuterium absorption in Mg70Al30 thin films with bilayer catalysts: A comparative neutron reflectometry study. , Journal of Alloys and Compounds 509 (2011), p. 5466-5471
doi:10.1016/j.jallcom.2011.02.111

Dodoo, S.; Steitz, R.; Laschewsky, A.; von Klitzing, R.: Effect of ionic strength and type of ions on the structure of water swollen polyelectrolyte multilayers. , Physical Chemistry Chemical Physics 13 (2011), p. 10318-10325
doi:10.1039/c0cp01357a

Jeworrek, C.; Steitz, R.; Czeslik, C.; Winter, R.: High pressure cell for neutron reflectivity measurements up to 2500 bar. , Review of Scientific Instruments 82 (2011), p. 025106/1-7
doi:10.1063/1.3553392

Khaydukov, Yu.N.; Aksenov, V.L.; Nikitenko, Yu.V.; Zhernenkov, K.N.; Nagy, B.; Teichert, A.; Steitz, R.; Rühm, A.; Bottyan, L.: Magnetic Proximity Effects in V/Fe Superconductor/Ferromagnet Single Bilayer Revealed by Waveguide-Enhanced Polarized Neutron Reflectometry. , Journal of Superconductivity and Novel Magnetism 24 (2011), p. 961-968
doi:10.1007/s10948-010-1041-0

Dante, S.; Hauss, T.; Steitz, R.; Canale, C.; Dencher, N.A.: Nanoscale structural and mechanical effects of beta-amyloid (1-42) on polymer cushioned membranes: A combined study by neutron reflectometry and AFM Force Spectroscopy. , Biochimica et Biophysica Acta - Biomembranes 1808 (2011), p. 2646-2655
doi:10.1016/j.bbamem.2011.07.024

Benckiser, E.; Haverkort, M.W.; Brueck, S.; Goering, E.; Macke, S.; Frano, A.; Yang, Xi.; Andersen, O.K.; Cristiani, G.; Habermeier, H.-U.; Boris, A.V.; Zegkinoglou, I.; Wochner, P.; Kim, H.-J.; Hinkov, V.; Keimer, B.: Orbital reflectometry of oxide heterostructures. , Nature Materials 10 (2011), p. 189-193
doi:10.1038/NMAT2958

Kreuzer, M.; Kaltofen, T.; Steitz, R.; Zehnder, B.H.; Dahint, R.: Pressure cell for investigations of solid-liquid interfaces by neutron reflectivity. , Review of Scientific Instruments 82 (2011), p. 023902/1-7
doi:10.1063/1.3505797

Evers, F.; Steitz, R.; Tolan, M.; Czeslik, C.: Reduced Protein Adsorption by Osmolytes. , Langmuir 27 (2011), p. 6995-7001
doi:10.1021/la2010908

Demeter, J.; Teichert, A.; Kiefer, K.; Wallacher, D.; Ryll, H.; Menendez, E.; Paramanik, D.; Steitz, R.; Van Haesendonck, C.; Vantomme, A.; Temst, K.: Simultaneous polarized neutron reflectometry and anisotropic magnetoresistance measurements. , Review of Scientific Instruments 82 (2011), p. 033902
doi:10.1063/1.3541839

Steitz, R.; Dahint, R.: Soft Functional Interfaces. , Advanced Engineering Materials 13 (2011), p. 773-783
doi:10.1002/adem.201100008

Kreuzer, Martin: Solid-supported lipid membranes under varied environmental conditions. , Universität Heidelberg, 2011
doi:10.5442/d0016

Paul, A.; Krist, T.; Teichert, A.; Steitz, R.: Specular and off-specular scattering with polarization and polarization analysis on reflectometer V6 at BER II, HZB. , Physica B 406 (2011), p. 1598-1606
doi:10.1016/j.physb.2011.02.005

Campana, M.; Teichert, A.; Clarke, S.; Steitz, R.; Webster, J.R.P.; Zarbakhsh, A.: Surfactant Adsorption at the Metal-Oil Interface. , Langmuir 27 (2011), p. 6085-6090
doi:10.1021/la200670w

2010

Franta, D.; Necas, D.; Zajickova, L.; Bursikova, V.; Cobet, C.: Band structure of diamond-like carbon films assessed from optical measurements in wide spectral range. , Diamond and Related Materials 19 (2010), p. 114-122
doi:10.1016/j.diamond.2009.08.003

Demeter, J.; Meersschaut, J.; Almeida, F.; Brems, S.; Van Haesendonck, C.; Teichert, A.; Steitz, R.; Temst, K.; Vantomme, A.: Exchange bias by implantation of O ions into Co thin films. , Applied Physics Letters 96 (2010), p. 132503/1-3
doi:10.1063/1.3377907

Soltwedel, O.; Ivanova, O.; Nestler, P.; Müller, M.; Köhler, R.; Helm, C.A.: Interdiffusion in Polyelectrolyte Multilayers. , Macromolecules 43 (2010), p. 7288-7293
doi:10.1021/ma101279q

Paul, A.; Teichert, A.: Manipulation of uncompensated moments in trained exchange bias systems. , Applied Physics Letters 97 (2010), p. 032505/1-3
doi:10.1063/1.3457440

Moraes, M.; Gomes, P.; Ribeiro, P.; Vieira, P.; Freitas, A.; Köhler, R.; Oliveira, O.; Raposo, M.: Polymeric scaffolds for enhanced stability of melanin incorporated in liposomes. , Journal of Colloid and Interface Science 350 (2010), p. 268-274
doi:10.1016/j.jis.2010.06.043

Evers, F.; Reichhart, C.; Steitz, R.; Tolan, M.; Czeslik, C.: Probing adsorption and aggregation of insulin at a poly(acrylic acid) brush. , Physical Chemistry Chemical Physics 12 (2010), p. 4375-4382
doi:10.1039/b925134k

Burmistrova, A.; Steitz, R.; von Klitzing, R.: Temperature Response of PNIPAM Derivatives at Planar Surfaces: Comparison between Polyelectrolyte Multilayers and Adsorbed Microgels. , ChemPhysChem 11 (2010), p. 3571-3579
doi:10.1002/cphc.201000378

Fleischmann, C.; Almeida, F.; Demeter, J.; Paredis, K.; Teichert, A.; Steitz, R.; Brems, S.; Opperdoes, B.; Van Haesendonck, C.; Vantomme, A.; Temst, K.: The influence of interface roughness on the magnetic properties of exchange biased CoO/Fe thin films. , Journal of Applied Physics 107 (2010), p. 113907/1-7
doi:10.1063/1.3391470

2009

Evers, F.; Steitz, R.; Tolan, M.; Czeslik, C.: Analysis of Hofmeister Effects on the Density Profile of Protein Adsorbates: A Neutron Reflectivity Study. , The Journal of Physical Chemistry B 113 (2009), p. 8462-8465
doi:10.1021/jp904065w

Jeworrek, C.; Hollmann, O.; Steitz, R.; Winter, R.; Czeslik, C.: Interaction of IAPP and Insulin with Model Interfaces Studied Using Neutron Reflectometry. , Biophysical Journal 96 (2009), p. 1115-1123
doi:10.1016/j.bpj.2008.11.006

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