Solid state X-ray emission and NEXAFS with extended temperature range for open port use



Liu, C.-Y.; Feng, P.; Ruotsalainen, K.; Bauer, K.; Decker, R.; Kusch, M.; Siewierska, K.; Pietzsch, A.; Haase, M.; Lu, Y.; de Groot, F.; Föhlisch, A.: Role of La 5p in bulk and quantum-confined solids probed by the La 5p54f1 3D1 excitonic final state of resonant inelastic x-ray scattering. , The Journal of Physical Chemistry C 127 (2023), p. 11111-11118
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Decker, R.; Born, A.; Ruotsalainen, K.; Bauer, K.; Haverkamp, R.; Büchner, R.; Pietzsch, A.; Föhlisch, A.: Spin-lattice angular momentum transfer of localized and valence electrons in the demagnetization transient state of gadolinium. , Applied Physics Letters 119 (2021), p. 152403/1-5
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Born, A.; Decker, R.; Büchner, R.; Haverkamp, R.; Ruotsalainen, K.; Bauer, K.; Pietzsch, A.; Föhlisch, A.: Thresholding of the Elliott-Yafet spin-flip scattering in multi-sublattice magnets by the respective exchange energies. , Scientific Reports 11 (2021), p. 1883/1-7
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Decker, R.; Born, A.; Büchner, R.; Ruotsalainen, K.; Stråhlman, C.; Neppl, S.; Haverkamp, R.; Pietzsch, A.; Föhlisch, A.: Measuring the atomic spin-flip scattering rate by x-ray emission spectroscopy. , Scientific Reports 9 (2019), p. 8977/1-6
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Miedema, P. S.; Thielemann-Kühn, N.; Alonso Calafell, I.; Schüßler-Langeheine, C.; Beye, M.: Strain analysis from M-edge resonant inelastic X-ray scattering of nickel oxide films. , Physical Chemistry Chemical Physics 21 (2019), p. 21596-21602
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Miedema, P.S.; Mitzner, R.; Ganschow, S.; Föhlisch, A.; Beye, M.: X-ray spectroscopy on the active ion in laser crystals. , Physical Chemistry Chemical Physics 19 (2017), p. 21800-21806
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Ghiasi, M.; Delgado-Jaime, M.U.; Malekzadeh, A.; Wang, R.-P.; Miedema, P.S.; Beye, M.; de Groot, F.M. F.: Mn and Co Charge and Spin Evolutions in LaMn1-xCoxO3 Nanoparticles. , The Journal of Physical Chemistry C 120 (2016), p. 8167-8174
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Miedema, P.S.; Beye, M.; Könnecke, R.; Schiwietz, G.; Föhlisch, A.: The angular- and crystal-momentum transfer through electron-phonon coupling in silicon and silicon carbide: similarities and differences. , New Journal of Physics 16 (2014), p. 093056/1-15
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Miedema, P.S.; Beye, M.; Könnecke, R.; Schiwietz, G.; Föhlisch, A.: Thermal evolution of the band edges of 6H-SiC: X-ray methods compared to the optical band gap. , Journal of Electron Spectroscopy and Related Phenomena 197 (2014), p. 37-42
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