Using focussed ion beams in research - HZB workshop on focussed ion-beam engineering and application areas
Focussed ion beams are highly useful tools for researchers in various disciplines. Samples can be etched in the micro- and nanometre range with them. Modern ion microscopes as well as their complementary methods and techniques are available at the HZB and can be utilised by scientists from universities and institutes from the world over. Now for the first time, the HZB is organising a workshop to introduce these methods and their areas of application. It will take place November 6th and 7th. The deadline for submitting abstracts is June 15.
“We would like to invite scientists as well as technicians to join us in a detailed and productive exchange of ideas and knowledge in our workshop. Those without previous experience are also welcome to attend in order to become acquainted with the opportunities offered by ion microscopy,” says Dr. Katja Höflich, from the HZB Department of Nanoscale Structures and Microscopic Analyses (EE-ANSMA) and co-organiser of the scientific workshop.
The three themes of the workshop are the fundamentals of ion/solid-state interactions, the preparation of nano-features having structural details below 10 nm (nanopatterning), and new approaches in sample preparation & analysis including imaging with ions.
The workshop is being presented in conjunction with the ZEISS company. The HZB and ZEISS have been working together since 2015 under the ZEISS lab@location programme for state-of-the-art microscopy that the company offers through selected research institutions (further information).
Abstracts and registration
Registration is now open and closes August 31, 2017. The number of participants is limited to 45.
Those who would like to give a talk at the workshop are requested submit an abstract by June 15th. Further information on the location and programme can be found on the website.