Progress in solar technologies – from research to application

EU group project presents its results: high efficiencies with less material

A workshop entitled "European Solar Technology Forum – from Research to Industrial Application" took place at HZB to conclude of the European CHEETAH project on November 30, 2017. More than 100 participants from the most important European research institutes in the field of photovoltaics and from numerous universities came together with representatives from industry in order to discuss the progress achieved by CHEETAH.

Three different types of soclar cells have been greatly improved:

Silicon photovoltaics: wafer thickness cut by half

Efforts in the field of silicon photovoltaics have been directed towards the use of ever-thinner wafers in manufacturing photovoltaic modules. Several modules whose cells were 90-100 microns thick were presented at the workshop. These enable considerable savings in materials compared to standard modules with cell thicknesses of 180 microns.

Reducing material consumption in chalcopyrite solar cells by implementing an integrated lens system.

The approach to saving materials in thin-film solar cells made of chalkopyrites (Cu(In,Ga)Se2) was different: the cells were reduced in area and an integrated lens system incorporated into the module to concentrate the sunlight irradiating the cells. The goal is to achieve an efficiency level at least as high as that of current commercial modules while using considerably less material. The first prototypes already demonstrate that the method works in principle and can even reach higher efficiency levels than standard cells under certain circumstances due to the higher light intensity.

Extending the operating life of hybrid solar cells

The third topic in CHEETAH involved organic and hybrid solar cells. In this part of the project, polymer encapsulation materials were measured in an extensive series of tests and correlated with the operating life of the cells. The operating life of these solar cells could be increased to several years using the best of these polymers.

The presentations can be viewed here

 

Iver Lauermann

  • Copy link

You might also be interested in

  • AI agents deliver results – but do they reason scientifically?
    News
    01.06.2026
    AI agents deliver results – but do they reason scientifically?
    A research team co-led by Kevin Maik Jablonka from the Helmholtz Institute for Polymers in Energy Applications Jena (HIPOLE Jena) and N. M. Anoop Krishnan from the Indian Institute of Technology Delhi has developed Corral, a new benchmark for AI agents in science. The preprint “AI scientists produce results without reasoning scientifically” has been published on arXiv (https://doi.org/10.48550/arXiv.2604.18805). The analysis shows that current systems can execute scientific workflows and deliver results; however, they often do not follow the basic principles of scientific testing and reasoning.
  • Materials chemistry shapes the future of catalysis
    Science Highlight
    29.05.2026
    Materials chemistry shapes the future of catalysis
    The synthesis of materials can serve as a tool for developing smart, adaptive electrocatalysts. This rapidly evolving field of research involves in-situ analytics, data-driven discoveries and autonomous robotics. These new approaches could accelerate the discovery of long-lasting and efficient catalysts for future energy conversion and the decarbonisation of the chemical industry. A recent article by Dr Prashanth Menezes and his team in the renowned journal Angewandte Chemie provides an overview of this research.
  • Imaging Ellipsometry for Process Control of Thin-Film Devices
    Science Highlight
    22.05.2026
    Imaging Ellipsometry for Process Control of Thin-Film Devices
    A German–Israeli research team led by Dr. Andreas Furchner has demonstrated how imaging ellipsometry enables non-destructive characterisation and quality control of microstructured MXene thin films during device fabrication. The authors used two complementary ellipsometry approaches for precise, multi-scale access to key material properties. The work positions imaging ellipsometry as a powerful platform for monitoring thin-film uniformity, device integrity, and functionality throughout processing, including critical lithographic steps.  The study was published in Applied Physics Letters and selected as an Editor’s Pick.