Pettenkofer, C.; Hofmann, A.; Bremsteller, W.; Lehmann, C.; Kelleter, F.: Photoelectron spectromicroscopy at chalcopyrite films. Ultramicroscopy 119 (2012), p. 102-105
10.1016/j.ultramic.2011.11.006
Open Access Version
Abstract:
CuInSe2 films were prepared by MBE on GaAs (111)A substrates. ZnSe and ZnO are subsequently deposited in situ by MOMBE. Interface parameters like band offsets and morphology are studied by X-ray photoelectron spectroscopy (XPS) and Low energy electron diffraction (LEED). Spectroscopic XPEEM (X-ray Photo electron emission microscopy) at the U49/2 PGM2 beamline at BESSY was used to investigate the lateral homogenity of the interface. After annealing in situ a lateral inhomogenious In diffusion is observed into the ZnSe/ZnO interface.