• Crespo Lopez-Urrutia, J.R.; Simon, M.C.; Beilmann, C.; Rudolph, J.; Steinbrügge, R.; Eberle, S.; Schwarz, M.; Baumann, T.M.; Schmitt, B.L.; Brunner, F.; Ginzel, R.; Klawitter, R.; Kubicek, K.; Epp, S.W.; Mokler, P.H.; Mäckel, V.; Ullrich, J.; Brown, G.V.; Graf, A.; Leutenegger, M.; Beiersdorfer, P.; Behar, E.; Follath, R.; Reichardt, G.; Schwarzkopf, O.: Photoionizing Trapped Highly Charged Ions with Synchrotron Radiation. In: Aggarwal, Kanti ... [Ed.] : The 17th International Conference on Atomic Processes in Plasmas (ICAPIP) Woodbury, NY : AIP Press, 2012 (AIP Conference Proceedings ; 1438). - ISBN 978-0-7354-1028-2, p. 80-85

10.1063/1.4707859
Open Access Version (externer Anbieter)

Abstract:
We review our recent high resolution experiments on photoabsorption by Fe14+ [M. C. Simon, et al., Phys. Rev. Lett. 105, 183001 (2010)], Fe15+, and Ar12+ [M. C. Simon, et al., J. Phys. B-At. Mol. Opt. Phys. 43, 065003 (2010)] at photon energies up to 1 keV. These ions play an essential role in photoionized astrophysical plasmas. Diagnostics of X-ray binary systems rely heavily on precise identification and knowledge of absorption lines. Novel experiments using an electron beam ion trap, FLASH EBIT, in combination with monochromatic synchrotron radiation allow us to investigate ions in charge states hitherto out of reach. Trapped ions can be prepared in any charge state at target densities sufficient to measure absorption cross sections below 0.1 Mb. This results in benchmark state-of-the-art predictions of the transitions wavelengths, widths, and absolute cross sections.