Guttmann, P.; Bittencourt, C.; Ke, X.; Van Tendeloo, G.; Umek, P.; Arcon, D.; Ewels, C.P.; Rehbein, S.; Heim, S.; Schneider, G.: TXM-NEXAFS of TiO2-Based Nanostructures. In: McNulty, I. [Ed.] : The 10th International Conference on X-Ray Microscopy. Woodbury, NY: AIP Press, 2011 (AIP Conference Proceedings ; 1365). - ISBN 978-0-7354-0925-5, p. 437-440
10.1063/1.3625396