Marciszko, M.; Baczmanski, A.; Klaus, M.; Genzel, C.; Oponowicz, A.; Wronski, S.; Wróbel, M.; Braham, C.; Sidhom, H.; Wawszczak, R.: A multireflection and multiwavelength residual stress determination method using energy dispersive diffraction. Journal of Applied Crystallography 51 (2018), p. 732-745
10.1107/S1600576718004193
Open Access Version
