Krug, M.; Weiss, M.S.; Heinemann, U.; Mueller, U.: XDSAPP: a graphical user interface for the convenient processing of diffraction data using XDS. Journal of Applied Crystallography 45 (2012), p. 568-572
10.1107/S0021889812011715

Abstract:
XDSAPP is a Tcl/Tk-based graphical user interface for the easy and convenient processing of diffraction data sets using XDS. It provides easy access to all XDS functionalities, automates the data processing and generates graphical plots of various data set statistics provided by XDS. By incorporating additional software, further information on certain features of the data set, such as radiation decay during data collection or the presence of pseudo-translational symmetry and/or twinning, can be obtained. Intensity files suitable for CCP4, CNS and SHELX are generated.