Publikationen 2019


Baumgärtel, P.; Grundmann, P.; Zeschke, T.; Erko, A.; Viefhaus, J.; Schäfers, F.; Schirmacher, H.: RAY-UI: New Features and Extensions. AIP Conference Proceedings 2054 (2019), p. 060034/1-6
doi:10.1063/1.5084665


Buck, J.; Bagschik, K.; Glaser, L.; Scholz, F.; Seltmann, J.; Viefhaus, J.: Progress Report on the XUV Online Diagnostic Unit for the Highly Accurate Determination of SR Properties. AIP Conference Proceedings 2054 (2019), p. 060057/1-7
doi:10.1063/1.5084688


Ferrari, E.; Roussel, E.; Buck, J.; Callegari, C.; Cucini, R.; De Ninno, G.; Diviacco, B.; Gauthier, D.; Giannessi, L.; Glaser, L.; Hartmann, G.; Penco, G.; Scholz, F.; Seltmann, J.; Shevchuk, I.; Viefhaus, J.; Zangrando, M.; Allaria, E.: Free electron laser polarization control with interfering crossed polarized fields. Physical Review Accelerators and Beams 22 (2019), p. 080701/1-16
doi:10.1103/PhysRevAccelBeams.22.080701


Grubert, B.; Kreitschik, D.; Schnabel, O.; Siewert, F.; Geckeler, R.; Schumann, M.; Just, A.; Krause, M.; Yandayan, T.; Akgoz, S.A.: A precise aperture centring device (ACenD) for autocollimator-based surface measuring profilers. In: Lahsen Assoufid, Haruhiko Ohashi, Anand Asundi [Ed.] : Advances in Metrology for X-Ray and EUV Optics VIII : 11-12 August 2019, San Diego, California, United States. Bellingham, Wash.: SPIE , 2019 (Proceedings of SPIE ; 11109). - ISBN 978-1-5106-2912-7, p. 1110902/1-14
doi:10.1117/12.2531613


Hartmann, G.; Ilchen, M.; Schmidt, Ph.; Küstner-Wetekam, C.; Ozga, C.; Scholz, F.; Buck, J.; Trinter, F.; Viefhaus, J.; Ehresmann, A.; Schöffler, M.S.; Knie, A.; Demekhin, Ph.V.: Recovery of High-Energy Photoelectron Circular Dichroism through Fano Interference. Physical Review Letters 123 (2019), p. 043202/1-6
doi:10.1103/PhysRevLett.123.043202


Heider, R.; Wagner, M. S.; Hartmann, N.; Ilchen, M.; Buck, J.; Hartmann, G.; Shirvanyan, V; Lindahl, A. O.; Gruenert, J.; Krzywinski, J.; Liu, J.; Ossiander, M.; Lutman, A. A.; Maxwell, T.; Miahnahri, A. A.; Moeller, S. P.; Planas, M.; Robinson, J.; Viefhaus, J.; Feurer, T.; Kienberger, R.; Coffee, R. N.; Helml, W.: Megahertz-compatible angular streaking with few-femtosecond resolution at x-ray free-electron lasers. Physical Review A 100 (2019), p. 053420/1-17
doi:10.1103/PhysRevA.100.053420


Herrero, A.; Pflüger, M.; Probst, J.; Scholze, F.; Soltwisch, V.: Applicability of the Debye-Waller damping factor for the determination of the line-edge roughness of lamellar gratings. Optics Express 27 (2019), p. 32490-32507
doi:10.1364/OE.27.032490
Open Access Version


Huang, Q.; Feng, J.; Li, T.; Wang, X.; Kozhenikov, I.V.; Yang, Y.; Qui, R.; Sokolov, A.; Giday Sertsu, M.; Schäfers, F.; Li, W.; Xie, C.; Zhang, Z.; Wang, Z.: Narrowband lamellar multilayer grating with low contrast MoSi2/Si materials for soft X-ray region. Journal of Physics D: Applied Physics 52 (2019), p. 195303/1-6
doi:10.1088/1361-6463/ab0873
Open Access Version


Lacey, I.; Anderson, K.; Dickert, J.; Geckeler, R.; Just, A.; Siewert, F.; Smith, B.; Yashchuk, V.: Transfer of autocollimator calibration for use with scanning gantry profilometers for accurate determination of surface slope and curvature of state-of-the-art x-ray mirrors. In: Lahsen Assoufid, Haruhiko Ohashi, Anand Asundi [Ed.] : Advances in Metrology for X-Ray and EUV Optics VIII : 11-12 August 2019, San Diego, California, United States. Bellingham, Wash.: SPIE, 2019 (Proceedings of SPIE ; 11109). - ISBN 978-1-5106-2912-7, p. 1110905/1-16
doi:10.1117/12.2529519
Open Access Version


Lacey, I.; Geckler, R.; Just, A.; Siewert, F.; Arnold, T.; Paetzelt, H.; Smith, B.; Yashchuk, V.: Optimization of the size and shape of the scanning aperture in autocollimator-based deflectometric profilometers. Review of Scientific Instruments 90 (2019), p. 021717/1-14
doi:10.1063/1.5058710


Laksman, J.; Buck, J.; Glaser, L.; Planas, M.; Dietrich, F.; Liu, J.; Maltezopoulos, T.; Scholz, F.; Seltmann, J.; Hartmann, G.; Ilchen, M.; Freund, W.; Kujala, N.; Viefhaus, J.; Grünert, J.: Commissioning of a photoelectron spectrometer for soft X-ray photon diagnostics at the European XFEL. Journal of Synchrotron Radiation 26 (2019), p. 1010-1016
doi:10.1107/S1600577519003552


Polkovnikov, V.N.; Chkhalo, N.I.; Pleshkov, R.S.; Salashchenko, N.N.; Schäfers, F.; Sertsu, M.; Sokolov, A.; Svechnikov, M.V.; Zuev, S.Yu.: Stable high-reflection Be/Mg multilayer mirrors for solar astronomy at 30.4 nm. Optics Letters 44 (2019), p. 263-266
doi:10.1364/OL.44.000263


Siewert, F.; Buchheim, J.; Gwalt, G.; Bean, R.; Mancuso, A.: On the characterization of a 1 m long, ultra-precise KB-focusing mirror pair for European XFEL by means of slope measuring deflectometry. Review of Scientific Instruments 90 (2019), p. 021713/1-9
doi:10.1063/1.5065473


Siewert, F.; Buchheim, J.; Gwalt, G.; Viefhaus, J.: On the characterization of ultra-precise XUV-focusing mirrors by means of slope-measuring deflectometry. In: Lahsen Assoufid, Haruhiko Ohashi, Anand Asundi [Ed.] : Advances in Metrology for X-Ray and EUV Optics VIII : 11-12 August 2019, San Diego, California, United States. Bellingham, Wash., 2019 (Proceedings of SPIE ; 11109). - ISBN 978-1-5106-2912-7, p. 111090N/1-11
doi:10.1117/12.2529308


Sokolov, A.; Huang, Q.; Senf, F.; Feng, J.; Lemke, S.; Alimov, S.; Knedel, J.; Zeschke, T.; Kutz, O.; Seliger, T.; Gwalt, G.; Schäfers, F.; Siewert, F.; Kozhevnikov, I.V.; Qi, R.; Zhang, Z.; Li, W.; Wang, Z.: Optimized highly efficient multilayer-coated blazed gratings for the tender X-ray region. Optics Express 27 (2019), p. 16833-16846
doi:10.1364/OE.27.016833
Open Access Version


Yashchuk, V.; Lacey, I.; Arnold, T.; Paetzelt, H.; Rochester, S.; Siewert, F.; Takacs, P.: Investigation on lateral resolution of surface slope profilers. In: Lahsen Assoufid, Haruhiko Ohashi, Anand Asundi [Ed.] : Advances in Metrology for X-Ray and EUV Optics VIII : 11-12 August 2019, San Diego, California, United States. Bellingham, Wash.: SPIE, 2019 (Proceedings of SPIE ; 11109). - ISBN 978-1-5106-2912-7, p. 111090M/1-19
doi:10.1117/12.2539527