U41-TXM
U41-TXM
This high flux beamline with a plane grating monochromator was designed especially for X-ray microscopy endstations. It is dedicated to X-ray microscopy applications and hosts the HZB X-ray microscope as a fixed endstation.
The new designed PGM1 beamline for the TXM endstation at section L06 uses again the undulator U41 which was moved from section L12 to L06. User operation at this new beamline started with the 2017-II beamtime allocation period.
The optical design of the HZB full-field TXM (unchanged) at the new BESSY II undulator beamline U41-L06-PGM1 (section L06) allows high spectral resolution of up to E/ΔE = 10000, 25 nm (half-pitch) spatial resolution and field of views in the range of 10-15 µm. A plane grating monochromator with a 800 l/mm grating provides the necessary high photon flux and in addition an energy resolution high enough for NEXAFS applications. The X-ray condenser (ellipsoidal shaped capillary) illuminates the object while the high resolving zone plate objective forms the enlarged image onto the CCD.
Details about the TXM itself can be found in the list of stations under XM - X-ray microscopy.
List of publications
| Beamline data | |
|---|---|
| Segment | L06 |
| Location (Pillar) | 7.2 |
| Source | U41 (planar undulator) |
| Monochromator | PGM1 equipped with a 800 l/mm grating |
| Energy range | 180 - 1800 eV |
| Energy resolution | up to 10000 |
| Flux | up to 4·1012 photons/sec @100 mA and 20 μm exit slit for cff = 2.25 directly after the exit slit |
| Polarisation | horizontal |
| Divergence horizontal | photon energy dependent: 0.2 - 0.1 mrad |
| Divergence vertical | photon energy dependent: 0.66 - 0.25 mrad |
| Focus size (hor. x vert.) | 220 µm in exit slit |
| Fixed endstation | XM - X-ray Microscopy |
| Flexible endstation(s) | no |
| User endstation | not possible |
| Distance Focus/last valve | - focus at exit slit position - mm |
| Height Focus/floor level | 1417 mm |
| Beam availability | 12h/d |
| Phone | +49 30 8062 12110 |
Application
This is a dedicated beamline for X-ray microscopy allowing nano-tomography and nano-spectroscopy (NEXAFS).