U41-TXM

This high flux beamline with a plane grating monochromator was designed especially for X-ray microscopy endstations. It is dedicated to X-ray microscopy applications and hosts the HZB X-ray microscope as a fixed endstation.
The new designed PGM1 beamline for the TXM endstation at section L06 uses again the undulator U41 which was moved from section L12 to L06. User operation at this new beamline started with the 2017-II beamtime allocation period.

The optical design of the HZB full-field TXM (unchanged) at the new BESSY II undulator beamline U41-L06-PGM1 (section L06) allows high spectral resolution of up to E/ΔE = 10000, 25 nm (half-pitch) spatial resolution and field of views in the range of 10-15 µm. A plane grating monochromator with a 800 l/mm grating provides the necessary high photon flux and in addition an energy resolution high enough for NEXAFS applications. The X-ray condenser (ellipsoidal shaped capillary) illuminates the object while the high resolving zone plate objective forms the enlarged image onto the CCD.

Details about the TXM itself can be found in the list of stations under XM - X-ray microscopy.

X-ray optical design of the new XM-beamline at section L06

List of publications

Applicable station(s)

	Temperature range	Pressure Range
XM - X-ray Microscopy	100 K to room temperature	samples under vacuum

Beamline data
Segment	L06
Location (Pillar)	7.2
Source	U41 (planar undulator)
Monochromator	PGM1 equipped with a 800 l/mm grating
Energy range	180 - 1800 eV
Energy resolution	up to 10000
Flux	up to 4·10¹² photons/sec @100 mA and 20 μm exit slit for cff = 2.25 directly after the exit slit
Polarisation	horizontal
Divergence horizontal	photon energy dependent: 0.2 - 0.1 mrad
Divergence vertical	photon energy dependent: 0.66 - 0.25 mrad
Focus size (hor. x vert.)	220 µm in exit slit
User endstation	not possible
Distance Focus/last valve	- focus at exit slit position - mm
Height Focus/floor level	1417 mm
Beam availability	12h/d
Phone	+49 30 8062 12110

View on the beamline and X-ray microscope (new location at L06)

Measured flux curve

$Measured energy resolution (Nitrogen-K-edge) for 1st and 2nd grating diffraction order$

Measured energy resolution (Nitrogen-K-edge) for 1st and 2nd grating diffraction order

Application

This is a dedicated beamline for X-ray microscopy allowing nano-tomography and nano-spectroscopy (NEXAFS).