U41-TXM

U41-TXM

This high flux beamline with a plane grating monochromator was designed especially for X-ray microscopy endstations. It is dedicated to X-ray microscopy applications  and hosts the HZB X-ray microscope as a fixed endstation.
The new designed PGM1 beamline for the TXM endstation at section L06 uses again the undulator U41 which was moved from section L12 to L06. User operation at this new beamline started with the 2017-II beamtime allocation period.

The optical design of the HZB full-field TXM (unchanged) at the new BESSY II undulator beamline U41-L06-PGM1 (section L06) allows high spectral resolution of up to E/ΔE = 10000, 25 nm (half-pitch) spatial resolution and field of views in the range of 10-15 µm. A plane grating monochromator with a 800 l/mm grating provides the necessary high photon flux and in addition an energy resolution high enough for NEXAFS applications. The X-ray condenser (ellipsoidal shaped capillary) illuminates the object while the high resolving zone plate objective forms the enlarged image onto the CCD.

Details about the TXM itself can be found in the list of stations under XM - X-ray microscopy.

X-ray optical design of the new XM-beamline at section L06

X-ray optical design of the new XM-beamline at section L06


List of publications

Applicable station(s)

Temperature rangePressure Range
XM - X-ray Microscopy 100 K to room temperaturesamples under vacuum
Beamline data
Segment L06
Location (Pillar) 7.2
Source U41 (planar undulator)
Monochromator PGM1 equipped with a 800 l/mm grating
Energy range 180 - 1800 eV
Energy resolution up to 10000
Flux up to 4·1012 photons/sec @100 mA and 20 μm exit slit for cff = 2.25 directly after the exit slit
Polarisation horizontal
Divergence horizontal photon energy dependent: 0.2 - 0.1 mrad
Divergence vertical photon energy dependent: 0.66 - 0.25 mrad
Focus size (hor. x vert.) 220 µm in exit slit
User endstation not possible
Distance Focus/last valve - focus at exit slit position - mm
Height Focus/floor level 1417 mm
Beam availability 12h/d
Phone +49 30 8062 12110
View on the beamline and X-ray microscope (new location at L06)

View on the beamline and X-ray microscope (new location at L06)

Measured flux curve

Measured flux curve

Measured energy resolution (Nitrogen-K-edge) for 1st and 2nd grating diffraction order

Measured energy resolution (Nitrogen-K-edge) for 1st and 2nd grating diffraction order


Application

This is a dedicated beamline for X-ray microscopy allowing nano-tomography and nano-spectroscopy (NEXAFS).