POLARIMETER
Polarimetry
Methods
Polarimetry, Reflectometry, Ellipsometry
Remote access
not possible
| Station data | |
|---|---|
| Temperature range | -- |
| Pressure range | -- |
| Detector | GaAsP |
| Manipulators | for details see technical description in pdf-file |
| Sample holder compatibility | -- |
| Additional equipment | |
| Assigned to beamline(s) | |
| UE52_SGM | 100 - 1500 eV |
| U49-2_PGM-1 | 85 - 1600 eV |
"A versatile UHV-polarimeter for the EUV XUV spectral range is described which incorporates two optical elements: a phase retarder and a reflection analyzer. Both optics are azimuthally rotatable around the incident synchrotron radiation beam and the incidence angle is freely selectable. This allows for a variety of reflectometry, polarimetry and ellipsometry applications on magnetic or non-magnetic samples and multilayer optical elements." http://dx.doi.org/10.17815/jlsrf-2-90
- Development of ML-optics for Polarisation Steering and Control
- Full control of Stokes vector (S1, S2, S3) in XUV-range (<1000 eV)
- Complete at-wavelength characterisiton of multilayer optics
- Measurement of complex reflection or transmission coefficients (Amplitudes and Phases)
- Polarisation Spectroscopy - Magneto-optics - XMCD, XMLD, T,L-MOKE, Faraday-, Kerr-effect
For more details contact the station scientist(s).