Reflectometry, Polarimetry, Ellipsometry

Station data
Temperature range --
Pressure Range --
Detector GaAsP
Manipulators for details see technical description in pdf-file
Sample holder compatibility --
Remote Access
Assigned to beamline(s)
UE56-2_PGM-2 60 - 1300 eV
UE52_SGM 100 - 1500 eV
U49-2_PGM-1 85 - 1600 eV

"A versatile UHV-polarimeter for the EUV XUV spectral range is described which incorporates two optical elements: a phase retarder and a reflection analyzer. Both optics are azimuthally rotatable around the incident synchrotron radiation beam and the incidence angle is freely selectable. This allows for a variety of reflectometry, polarimetry and ellipsometry applications on magnetic or non-magnetic samples and multilayer optical elements." http://dx.doi.org/10.17815/jlsrf-2-90

  • Development of ML-optics for Polarisation Steering and Control
  • Full control of Stokes vector (S1, S2, S3) in XUV-range (<1000 eV)
  • Complete at-wavelength characterisiton of multilayer optics
  • Measurement of complex reflection or transmission coefficients (Amplitudes and Phases)
  • Polarisation Spectroscopy - Magneto-optics - XMCD, XMLD, T,L-MOKE, Faraday-, Kerr-effect

For more details contact the station scientist(s).