Spin resolved Photoemission Microscope
Magnetic nanostructures are at the heart of modern data storage technology. Typical dimensions of magnetic bits are in the sub-100nm region. In addition novel magnetoelectronics devices such as magnetic random access memory junctions are operated on the sub-100nm m scale. An understanding magnetic properties of such low-dimensional structures is only accessible to spectro-microscopy tools capable of appropriate lateral resolution. This goal is achieved by combining a novel spin-resolved photoemission microscope (SPEEM) with a dedicated microfocus PGM beamline with full x-ray polarization control (UE49-PGMa).
The synergy between the microscopy capabilities of the PEEM and the polarization control of synchrotron radiation makes of X-PEEM the ideal tool for space resolved and element selective investigation of nanostructures by means of chemical maps (XAS) and magnetic imaging (XMCD and XLD).
For a detailed description of the experimental station as well as for an overview of the experimental possibilities of our microscope, please visit the following link XPEEMList of publications
|Temperature range||65 - 2000 K|
|Sample holder compatibility|
|Sample size||2mmX2mm to 20mmX20mm|
|Magnetic field||up to 75 mm depending on sample holder Oe|
|Beam focus size on sample||20(V)X30(H) micrometer|
|Sample storage in vacuum||up to 6|
|in-situ evaporation||Fe, Co, Ni, Al...|
|in-situ sputtering||Ar and O|
|Energy resolution||10.000 at 700eV|
|Energy range||80 to 1800 eV|
|Phone||+49 30 8062 14750|