Method: X-ray Microscopy

X-ray Microscopy

Station Energy Range Polarisation Beamline Contact
LEEM-PEEM 55 - 1500 eV • horizontal
• vertical
• circular
UE56-1_SGM Stefan Cramm
MAXYMUS 200 - 1900 eV Horizontal, Vertical, Circular positive, Circular negative UE46_MAXYMUS Markus Weigand
Sebastian Wintz
Michael Bechtel
Simone Raoux
MYSTIIC 80 - 2000 eV horizontal, vertical, circular UE48_EMIL Markus Weigand
Simone Raoux
SMART 100 - 1800 eV variable (linear and circular) UE49_PGM SMART Thomas Schmidt
Marcel Springer
Stephan Pohl
SPEEM 100 - 1800 eV variable UE49_PGM SPEEM Florian Kronast
Sergio Valencia Molina
Mohamad-Assaad Mawass
XM - X-ray Microscopy 250 - 2800 eV horizontal U41-TXM Stephan Werner