Resonant Scattering
Resonant scattering for open port use
Methods
Single Crystal Diffraction, Surface Diffraction, Magnetic Scattering, REXS, WAXS, EXAFS, NEXAFS, XMCD, XMLD, Time-resolved absorption, Reflectometry
Remote access
not possible
| Station data | |
|---|---|
| Temperature range | low-temperature sample holder 6.5 - 300 K, high temperature sample holder 80 - 650 K |
| Pressure range | 5 x 10-8 mbar (regular), < 2 x 10-9 mbar (after bakeout) |
| Detector | In-vacuum CCD, photo diode, APD |
| Manipulators | x,y,z,th,chi,phi(manual) |
| Sample holder compatibility | Own system, can accommodate samples of various shapes. Please contact us beforehand. |
| Additional equipment | |
| Applicable at beamline(s) | |
| UE52_SGM | 100 - 1500 eV |
| UE112_PGM-1 | 8 - 690 eV; for extreme values (<50 eV or >400 eV) contact the beamline crew |
| KMC-1 | Si(111):2 - 12 keV; Si(311): 4 - 12 keV; Si(422): 6 - 12 keV |
UHV chamber for soft x-ray scattering experiments with in-vacuum CCD detector.
For more details and current status of the experimental station contact the station scientist(s).
- Different detectors including in vacuum CCD, Si diode, APD detectors can be rotated around the sample.
- Different sample stages for low temperatures (6.5 K ... 300 K) without sample transfer, and either 20 K ... 400 K or 80 K ... 650 K with sample transfer system.
- Motorized x,y,z,th,chi (+- 3 deg) manipulator, manual phi rotation.
- Motorized vertical translation of all detectors.
- Control software SPEC.